Applications of a novel electron energy filter combined with a hybrid-pixel direct electron detector for the analysis of functional oxides by STEM/EELS and energy-filtered imaging.
Analytical scanning transmission electron microscopy
Electron energy-loss spectroscopy (EELS)
Energy filter
Energy-filtered imaging (EFI)
Functional oxides
Hybrid-pixel, direct electron detector
Journal
Micron (Oxford, England : 1993)
ISSN: 1878-4291
Titre abrégé: Micron
Pays: England
ID NLM: 9312850
Informations de publication
Date de publication:
Sep 2022
Sep 2022
Historique:
received:
10
06
2022
revised:
13
07
2022
accepted:
15
07
2022
pubmed:
27
7
2022
medline:
27
7
2022
entrez:
26
7
2022
Statut:
ppublish
Résumé
The performance and suitability of a new electron energy filter in combination with a hybrid pixel, direct electron detector for analytical (scanning) transmission electron microscopy are demonstrated using four examples. The STEM-EELS capabilities of the CEOS Energy Filtering and Imaging Device (CEFID) were tested with focus on weak signals and high spatio-temporal resolution. A multiferroic, multilayer structure of REMnO
Identifiants
pubmed: 35882179
pii: S0968-4328(22)00127-5
doi: 10.1016/j.micron.2022.103331
pii:
doi:
Types de publication
Journal Article
Langues
eng
Sous-ensembles de citation
IM
Pagination
103331Informations de copyright
Copyright © 2022 The Authors. Published by Elsevier Ltd.. All rights reserved.