Hafnium Oxide Nanostructured Thin Films: Electrophoretic Deposition Process and DUV Photolithography Patterning.

DUV electrophoretic deposition hafnium oxide hydrothermal micropatterning nanoarchitectonic nanoparticles photolithography thin films

Journal

Nanomaterials (Basel, Switzerland)
ISSN: 2079-4991
Titre abrégé: Nanomaterials (Basel)
Pays: Switzerland
ID NLM: 101610216

Informations de publication

Date de publication:
07 Jul 2022
Historique:
received: 25 05 2022
revised: 21 06 2022
accepted: 29 06 2022
entrez: 27 7 2022
pubmed: 28 7 2022
medline: 28 7 2022
Statut: epublish

Résumé

In the frame of the nanoarchitectonic concept, the objective of this study was to develop simple and easy methods to ensure the preparation of polymorphic HfO2 thin film materials (<200 nm) having the best balance of patterning potential, reproducibility and stability to be used in optical, sensing or electronic fields. The nanostructured HfO2 thin films with micropatterns or continuous morphologies were synthesized by two different methods, i.e., the micropatterning of sol-gel solutions by deep ultraviolet (DUV) photolithography or the electrophoretic deposition (EPD) of HfO2 nanoparticles (HfO2-NPs). Amorphous and monoclinic HfO2 micropatterned nanostructured thin films (HfO2-DUV) were prepared by using a sol-gel solution precursor (HfO2-SG) and spin-coating process following by DUV photolithography, whereas continuous and dense monoclinic HfO2 nanostructured thin films (HfO2-EPD) were prepared by the direct EPD of HfO2-NPs. The HfO2-NPs were prepared by a hydrothermal route and studied through the changing aging temperature, pH and reaction time parameters to produce nanocrystalline particles. Subsequently, based on the colloidal stability study, suspensions of the monoclinic HfO2-NPs with morphologies near spherical, spindle- and rice-like shapes were used to prepare HfO2-EPD thin films on conductive indium-tin oxide-coated glass substrates. Morphology, composition and crystallinity of the HfO2-NPs and thin films were investigated by powder and grazing incidence X-ray diffraction, scanning electron microscopy, transmission electron microscopy and UV-visible spectrophotometry. The EPD and DUV photolithography performances were explored and, in this study, it was clearly demonstrated that these two complementary methods are suitable, simple and effective processes to prepare controllable and tunable HfO2 nanostructures as with homogeneous, dense or micropatterned structures.

Identifiants

pubmed: 35889559
pii: nano12142334
doi: 10.3390/nano12142334
pmc: PMC9320788
pii:
doi:

Types de publication

Journal Article

Langues

eng

Subventions

Organisme : Agence Nationale de la Recherche
ID : ANR-18-CE08-0022

Références

Nanoscale. 2021 Jul 15;13(27):11635-11678
pubmed: 34190282
Opt Lett. 2012 Nov 15;37(22):4651-3
pubmed: 23164868
Sci Rep. 2017 Aug 24;7(1):9351
pubmed: 28839143
ACS Appl Mater Interfaces. 2020 Nov 25;12(47):52492-52499
pubmed: 33185107
ACS Appl Mater Interfaces. 2022 Jan 12;14(1):1290-1303
pubmed: 34942076
Sci Technol Adv Mater. 2019 Jan 31;20(1):51-95
pubmed: 30787960
Nanoscale Res Lett. 2022 Jan 24;17(1):17
pubmed: 35072820
Adv Mater. 2018 Dec;30(50):e1800923
pubmed: 30073719
Nanomaterials (Basel). 2020 Aug 14;10(8):
pubmed: 32823865
RSC Adv. 2020 Feb 28;10(14):8385-8395
pubmed: 35497823

Auteurs

Vanessa Proust (V)

CEA, DES, ISEC, DMRC, Université de Montpellier, F-30200 Marcoule, France.
Research Center for Functional Materials, National Institute for Materials Science (NIMS), Tsukuba 305-0044, Japan.
CNRS-Saint Gobain-NIMS, IRL 3629, Laboratory for Innovative Key Materials and Structures (LINK), NIMS, Tsukuba 305-0044, Japan.

Quentin Kirscher (Q)

Université de Haute-Alsace, CNRS, IS2M UMR 7361, F-68100 Mulhouse, France.
Université de Strasbourg, F-67081 Strasbourg, France.

Thi Kim Ngan Nguyen (TKN)

CNRS-Saint Gobain-NIMS, IRL 3629, Laboratory for Innovative Key Materials and Structures (LINK), NIMS, Tsukuba 305-0044, Japan.
International Center for Young Scientists, ICYS-Sengen, Global Networking Division, NIMS, Tsukuba 305-0047, Japan.

Lisa Obringer (L)

Université de Haute-Alsace, CNRS, IS2M UMR 7361, F-68100 Mulhouse, France.
Université de Strasbourg, F-67081 Strasbourg, France.

Kento Ishii (K)

Research Center for Functional Materials, National Institute for Materials Science (NIMS), Tsukuba 305-0044, Japan.

Ludivine Rault (L)

Univ Rennes, CNRS, ISCR UMR 6226, ScanMAT UAR 2025, F-35000 Rennes, France.

Valérie Demange (V)

Univ Rennes, CNRS, ISCR UMR 6226, ScanMAT UAR 2025, F-35000 Rennes, France.

David Berthebaud (D)

CNRS-Saint Gobain-NIMS, IRL 3629, Laboratory for Innovative Key Materials and Structures (LINK), NIMS, Tsukuba 305-0044, Japan.

Naoki Ohashi (N)

Research Center for Functional Materials, National Institute for Materials Science (NIMS), Tsukuba 305-0044, Japan.
CNRS-Saint Gobain-NIMS, IRL 3629, Laboratory for Innovative Key Materials and Structures (LINK), NIMS, Tsukuba 305-0044, Japan.

Tetsuo Uchikoshi (T)

Research Center for Functional Materials, National Institute for Materials Science (NIMS), Tsukuba 305-0044, Japan.
CNRS-Saint Gobain-NIMS, IRL 3629, Laboratory for Innovative Key Materials and Structures (LINK), NIMS, Tsukuba 305-0044, Japan.

Dominique Berling (D)

Université de Haute-Alsace, CNRS, IS2M UMR 7361, F-68100 Mulhouse, France.
Université de Strasbourg, F-67081 Strasbourg, France.

Olivier Soppera (O)

Université de Haute-Alsace, CNRS, IS2M UMR 7361, F-68100 Mulhouse, France.
Université de Strasbourg, F-67081 Strasbourg, France.

Fabien Grasset (F)

CNRS-Saint Gobain-NIMS, IRL 3629, Laboratory for Innovative Key Materials and Structures (LINK), NIMS, Tsukuba 305-0044, Japan.
Univ Rennes, CNRS, ISCR UMR 6226, ScanMAT UAR 2025, F-35000 Rennes, France.

Classifications MeSH