Linear imaging theory for differential phase contrast and other phase imaging modes in scanning transmission electron microscopy.

Journal

Ultramicroscopy
ISSN: 1879-2723
Titre abrégé: Ultramicroscopy
Pays: Netherlands
ID NLM: 7513702

Informations de publication

Date de publication:
Oct 2022
Historique:
received: 15 05 2022
revised: 13 06 2022
accepted: 21 06 2022
pubmed: 1 8 2022
medline: 1 8 2022
entrez: 31 7 2022
Statut: ppublish

Résumé

We propose a linear imaging theory for differential phase contrast under the weak-phase-weak-amplitude object approximation. Contrast transfer functions are defined for thin and thick weak objects, and they successfully describe several imaging characteristics of differential phase contrast. We discuss the defocus dependence of the contrast for several examples: atomic resolution, a p-n junction, a heterointerface, and grain boundaries. Understanding the imaging characteristics helps in adjusting aberrations in DPC STEM.

Identifiants

DOI: 10.1016/j.ultramic.2022.113580 PMID: 35908324
pubmed: 35908324
pii: S0304-3991(22)00110-3
doi: 10.1016/j.ultramic.2022.113580
pii:
doi:

Types de publication

Journal Article

Langues

eng

Sous-ensembles de citation

IM

Pagination

113580

Informations de copyright

Copyright © 2022 Elsevier B.V. All rights reserved.

Auteurs

Takehito Seki (T)

Institute of Engineering Innovation, School of Engineering, The University of Tokyo, Tokyo, 113-8656, Japan; PRESTO, Japan Science and Technology Agency, Kawaguchi, 332-0012, Japan. Electronic address: seki@sigma.t.u-tokyo.ac.jp.

Kushagra Khare (K)

School of Physics and Astronomy, Monash University, Clayton, Victoria, 3800, Australia.

Yoshiki O Murakami (YO)

Institute of Engineering Innovation, School of Engineering, The University of Tokyo, Tokyo, 113-8656, Japan.

Satoko Toyama (S)

Institute of Engineering Innovation, School of Engineering, The University of Tokyo, Tokyo, 113-8656, Japan.

Gabriel Sánchez-Santolino (G)

Institute of Engineering Innovation, School of Engineering, The University of Tokyo, Tokyo, 113-8656, Japan.

Hirokazu Sasaki (H)

Analysis Technology Center, Furukawa Electric Co., Ltd., Yokohama, 220-0073, Japan.

Scott D Findlay (SD)

School of Physics and Astronomy, Monash University, Clayton, Victoria, 3800, Australia.

Timothy C Petersen (TC)

Monash Centre for Electron Microscopy, Monash University, Clayton, Victoria, 3800, Australia.

Yuichi Ikuhara (Y)

Institute of Engineering Innovation, School of Engineering, The University of Tokyo, Tokyo, 113-8656, Japan; Nanostructures Research Laboratory, Japan Fine Ceramic Center, Atsuta-ku, Nagoya, 456-8587, Japan.

Naoya Shibata (N)

Institute of Engineering Innovation, School of Engineering, The University of Tokyo, Tokyo, 113-8656, Japan; Nanostructures Research Laboratory, Japan Fine Ceramic Center, Atsuta-ku, Nagoya, 456-8587, Japan. Electronic address: shibata@sigma.t.u-tokyo.ac.jp.

Classifications MeSH