Identification of ultra-thin molecular layers atop monolayer terraces in sub-monolayer organic films with scanning probe microscopy.

Height measurement Organic conjugated molecules Organic film growth Scanning probe microscopy Sexithiophene Ultrathin films

Journal

Ultramicroscopy
ISSN: 1879-2723
Titre abrégé: Ultramicroscopy
Pays: Netherlands
ID NLM: 7513702

Informations de publication

Date de publication:
Oct 2022
Historique:
received: 31 03 2022
accepted: 21 07 2022
pubmed: 6 8 2022
medline: 6 8 2022
entrez: 5 8 2022
Statut: ppublish

Résumé

The morphology of sub-monolayer sexithiophene films has been investigated in situ and ex situ as a function of the substrate temperature of deposition. In this thickness range, monolayer terraces formed of edge-on molecules, i.e. nearly upright, are typically nucleated. Herein, the terrace height is found to be correlated to both the film morphology and the substrate surface energy. In particular, the presence of a layer of variable thickness with molecules lying face-on or side-on can be identified atop the terraces when the deposition is carried out on inert substrates. This phenomenon can be evidenced thanks to accurate height measurements made with atomic force microscopy and further data obtained with advanced scanning probe microscopy techniques operating in different environments, viz. liquid, air and vacuum. An upward displacement of molecules from the substrate to the top of the terraces is considered to be responsible of this layer formation, whose molecules weakly interact with the underlying terraces.

Identifiants

pubmed: 35930930
pii: S0304-3991(22)00115-2
doi: 10.1016/j.ultramic.2022.113598
pii:
doi:

Types de publication

Journal Article

Langues

eng

Sous-ensembles de citation

IM

Pagination

113598

Informations de copyright

Copyright © 2022 Elsevier B.V. All rights reserved.

Auteurs

Stefano Chiodini (S)

Consiglio Nazionale delle Ricerche - Istituto per lo Studio dei Materiali Nanostrutturati (CNR-ISMN) via P. Gobetti 101, 40129 Bologna, Italy; Center for Nano Science and Technology, Fondazione Istituto Italiano di Tecnologia, Milan 20133, Italy.

Franco Dinelli (F)

Consiglio Nazionale delle Ricerche - Istituto Nazionale di Ottica (CNR-INO) via G. Moruzzi 1, 56124 Pisa, Italy.

Nicolas F Martinez (NF)

ScienTec Ibérica, Rufino Sánchez 83, planta 2, Oficina 1, 28290 Las Rozas (Madrid), Spain.

Stefano Donati (S)

Center for Nano Science and Technology, Fondazione Istituto Italiano di Tecnologia, Milan 20133, Italy.

Cristiano Albonetti (C)

Consiglio Nazionale delle Ricerche - Istituto per lo Studio dei Materiali Nanostrutturati (CNR-ISMN) via P. Gobetti 101, 40129 Bologna, Italy. Electronic address: cristiano.albonetti@cnr.it.

Classifications MeSH