Experimental Observation of ABCB Stacked Tetralayer Graphene.

Raman spectroscopy few-layer graphene nanoinfrared imaging optical conductivity rhombohedral scanning near-field optical microscopy stacking order

Journal

ACS nano
ISSN: 1936-086X
Titre abrégé: ACS Nano
Pays: United States
ID NLM: 101313589

Informations de publication

Date de publication:
25 Oct 2022
Historique:
pubmed: 8 10 2022
medline: 8 10 2022
entrez: 7 10 2022
Statut: ppublish

Résumé

In tetralayer graphene, three inequivalent layer stackings should exist; however, only rhombohedral (ABCA) and Bernal (ABAB) stacking have so far been observed. The three stacking sequences differ in their electronic structure, with the elusive third stacking (ABCB) being unique as it is predicted to exhibit an intrinsic bandgap as well as locally flat bands around the K points. Here, we use scattering-type scanning near-field optical microscopy and confocal Raman microscopy to identify and characterize domains of ABCB stacked tetralayer graphene. We differentiate between the three stacking sequences by addressing characteristic interband contributions in the optical conductivity between 0.28 and 0.56 eV with amplitude and phase-resolved near-field nanospectroscopy. By normalizing adjacent flakes to each other, we achieve good agreement between theory and experiment, allowing for the unambiguous assignment of ABCB domains in tetralayer graphene. These results establish near-field spectroscopy at the interband transitions as a semiquantitative tool, enabling the recognition of ABCB domains in tetralayer graphene flakes and, therefore, providing a basis to study correlation physics of this exciting phase.

Identifiants

pubmed: 36205460
doi: 10.1021/acsnano.2c06053
doi:

Types de publication

Journal Article

Langues

eng

Sous-ensembles de citation

IM

Pagination

16617-16623

Auteurs

Konstantin G Wirth (KG)

1st Institute of Physics (IA), RWTH Aachen University, 52074 Aachen, Germany.

Jonas B Hauck (JB)

Institute for Theory of Statistical Physics, RWTH Aachen University and JARA Fundamentals of Future Information Technology, 52062 Aachen, Germany.

Alexander Rothstein (A)

2nd Institute of Physics and JARA-FIT, RWTH Aachen University, 52074 Aachen, Germany.
Peter Grünberg Institute (PGI-9), Forschungszentrum Jülich, 52425 Jülich, Germany.

Hristiyana Kyoseva (H)

2nd Institute of Physics and JARA-FIT, RWTH Aachen University, 52074 Aachen, Germany.

Dario Siebenkotten (D)

1st Institute of Physics (IA), RWTH Aachen University, 52074 Aachen, Germany.

Lukas Conrads (L)

1st Institute of Physics (IA), RWTH Aachen University, 52074 Aachen, Germany.

Lennart Klebl (L)

Institute for Theory of Statistical Physics, RWTH Aachen University and JARA Fundamentals of Future Information Technology, 52062 Aachen, Germany.

Ammon Fischer (A)

Institute for Theory of Statistical Physics, RWTH Aachen University and JARA Fundamentals of Future Information Technology, 52062 Aachen, Germany.

Bernd Beschoten (B)

2nd Institute of Physics and JARA-FIT, RWTH Aachen University, 52074 Aachen, Germany.

Christoph Stampfer (C)

2nd Institute of Physics and JARA-FIT, RWTH Aachen University, 52074 Aachen, Germany.
Peter Grünberg Institute (PGI-9), Forschungszentrum Jülich, 52425 Jülich, Germany.

Dante M Kennes (DM)

Institute for Theory of Statistical Physics, RWTH Aachen University and JARA Fundamentals of Future Information Technology, 52062 Aachen, Germany.
Center for Free Electron Laser Science, Max Planck Institute for the Structure and Dynamics of Matter, 22761 Hamburg, Germany.

Lutz Waldecker (L)

2nd Institute of Physics and JARA-FIT, RWTH Aachen University, 52074 Aachen, Germany.

Thomas Taubner (T)

1st Institute of Physics (IA), RWTH Aachen University, 52074 Aachen, Germany.

Classifications MeSH