Smart Modulators Based on Electric Field-Triggering of Surface Plasmon-Polariton for Active Plasmonics.

LIPSS SERS modification nanostructures plasmon excitation polymer sensor smart materials thin layers

Journal

Nanomaterials (Basel, Switzerland)
ISSN: 2079-4991
Titre abrégé: Nanomaterials (Basel)
Pays: Switzerland
ID NLM: 101610216

Informations de publication

Date de publication:
27 Sep 2022
Historique:
received: 06 09 2022
revised: 20 09 2022
accepted: 26 09 2022
entrez: 14 10 2022
pubmed: 15 10 2022
medline: 15 10 2022
Statut: epublish

Résumé

Design and properties of a plasmonic modulator in situ tunable by electric field are presented. Our design comprises the creation of periodic surface pattern on the surface of an elastic polymer supported by a piezo-substrate by excimer laser irradiation and subsequent selective coverage by silver by tilted angle vacuum evaporation. The structure creation was confirmed by AFM and FIB-SEM techniques. An external electric field is used for fine control of the polymer pattern amplitude, which tends to decrease with increasing voltage. As a result, surface plasmon-polariton excitation is quenched, leading to the less pronounced structure of plasmon response. This quenching was checked using UV-Vis spectroscopy and SERS measurements, and confirmed by numerical simulation. All methods prove the proposed functionality of the structures enabling the creation smart plasmonic materials for a very broad range of advanced optical applications.

Identifiants

pubmed: 36234493
pii: nano12193366
doi: 10.3390/nano12193366
pmc: PMC9565573
pii:
doi:

Types de publication

Journal Article

Langues

eng

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Auteurs

Jan Švanda (J)

Department of Solid State Engineering, University of Chemistry and Technology Prague, 166 28 Prague, Czech Republic.
Baumit, Spol. s.r.o., 250 01 Brandys nad Labem-Stara Boleslav, Czech Republic.

Yevgeniya Kalachyova (Y)

Research School of Chemistry and Applied Biomedical Sciences, Tomsk Polytechnic University, 634049 Tomsk, Russia.

David Mareš (D)

Department of Microelectronics, Faculty of Electrical Engineering, Czech Technical University, 166 27 Prague, Czech Republic.

Jakub Siegel (J)

Department of Solid State Engineering, University of Chemistry and Technology Prague, 166 28 Prague, Czech Republic.

Petr Slepička (P)

Department of Solid State Engineering, University of Chemistry and Technology Prague, 166 28 Prague, Czech Republic.

Zdeňka Kolská (Z)

Faculty of Science, J. E. Purkyně University, 400 96 Usti nad Labem, Czech Republic.

Petr Macháč (P)

Department of Solid State Engineering, University of Chemistry and Technology Prague, 166 28 Prague, Czech Republic.

Štefan Michna (Š)

Faculty of Mechanical Engineering, J. E. Purkyně University, 400 96 Usti nad Labem, Czech Republic.

Václav Švorčík (V)

Department of Solid State Engineering, University of Chemistry and Technology Prague, 166 28 Prague, Czech Republic.

Oleksiy Lyutakov (O)

Department of Solid State Engineering, University of Chemistry and Technology Prague, 166 28 Prague, Czech Republic.
Research School of Chemistry and Applied Biomedical Sciences, Tomsk Polytechnic University, 634049 Tomsk, Russia.

Classifications MeSH