Investigation of deposition temperature effect on spatial patterns of MgF
MgF2 films
fractal and multifractal analysis
micromorphology
surface homogeneity
surface percolation
Journal
Microscopy research and technique
ISSN: 1097-0029
Titre abrégé: Microsc Res Tech
Pays: United States
ID NLM: 9203012
Informations de publication
Date de publication:
Feb 2023
Feb 2023
Historique:
revised:
12
09
2022
received:
17
07
2022
accepted:
06
10
2022
pubmed:
20
10
2022
medline:
20
10
2022
entrez:
19
10
2022
Statut:
ppublish
Résumé
In this work, the atomic force microscopy (AFM) technique was used to characterize 3D MgF
Types de publication
Journal Article
Langues
eng
Sous-ensembles de citation
IM
Pagination
169-180Subventions
Organisme : Laboratório de Síntese de Nanomateriais e Nanoscopia (LSNN)
ID : CNPq 442601/2019-0
Informations de copyright
© 2022 Wiley Periodicals LLC.
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