Origin of the Critical Thickness in Improper Ferroelectric Thin Films.
YMnO3
critical thickness
electron energy loss spectroscopy
improper ferroelectricity
interfaces
oxygen vacancies
transmission electron microscopy
Journal
ACS applied materials & interfaces
ISSN: 1944-8252
Titre abrégé: ACS Appl Mater Interfaces
Pays: United States
ID NLM: 101504991
Informations de publication
Date de publication:
12 Apr 2023
12 Apr 2023
Historique:
medline:
31
3
2023
pubmed:
31
3
2023
entrez:
30
3
2023
Statut:
ppublish
Résumé
Improper ferroelectrics are expected to be more robust than conventional ferroelectrics against depolarizing field effects and to exhibit a much-desired absence of critical thickness. Recent studies, however, revealed the loss of ferroelectric response in epitaxial improper ferroelectric thin films. Here, we investigate improper ferroelectric hexagonal YMnO
Identifiants
pubmed: 36996320
doi: 10.1021/acsami.3c00412
doi:
Types de publication
Journal Article
Langues
eng
Sous-ensembles de citation
IM