Superconformal Film Growth: From Smoothing Surfaces to Interconnect Technology.
Journal
Accounts of chemical research
ISSN: 1520-4898
Titre abrégé: Acc Chem Res
Pays: United States
ID NLM: 0157313
Informations de publication
Date de publication:
02 May 2023
02 May 2023
Historique:
medline:
20
4
2023
pubmed:
20
4
2023
entrez:
20
04
2023
Statut:
ppublish
Résumé
ConspectusElectronics manufacturing involves Cu electrodeposition to form 3D circuitry of arbitrary complexity. This ranges from nanometer-wide interconnects between individual transistors to increasingly large multilevel intermediate and global scale on-chip wiring. At larger scale, similar technology is used to form micrometer-sized high aspect ratio through-silicon vias (TSV) that facilitate chip stacking and multilevel printed circuit board (PCB) metallization. Common to all of these applications is void-free Cu filling of lithographically defined trenches and vias. While line-of-sight physical vapor deposition processes cannot accomplish this feat, the combination of surfactants and electrochemical or chemical vapor deposition enables preferential metal deposition within recessed surface features known as superfilling. The same superconformal film growth processes account for the long-reported but poorly understood smoothing and brightening action provided by certain electroplating additives. Prototypical surfactant additives for superconformal Cu deposition from acid-based CuSO
Identifiants
pubmed: 37076974
doi: 10.1021/acs.accounts.2c00840
doi:
Types de publication
Journal Article
Langues
eng
Sous-ensembles de citation
IM