Superconformal Film Growth: From Smoothing Surfaces to Interconnect Technology.


Journal

Accounts of chemical research
ISSN: 1520-4898
Titre abrégé: Acc Chem Res
Pays: United States
ID NLM: 0157313

Informations de publication

Date de publication:
02 May 2023
Historique:
medline: 20 4 2023
pubmed: 20 4 2023
entrez: 20 04 2023
Statut: ppublish

Résumé

ConspectusElectronics manufacturing involves Cu electrodeposition to form 3D circuitry of arbitrary complexity. This ranges from nanometer-wide interconnects between individual transistors to increasingly large multilevel intermediate and global scale on-chip wiring. At larger scale, similar technology is used to form micrometer-sized high aspect ratio through-silicon vias (TSV) that facilitate chip stacking and multilevel printed circuit board (PCB) metallization. Common to all of these applications is void-free Cu filling of lithographically defined trenches and vias. While line-of-sight physical vapor deposition processes cannot accomplish this feat, the combination of surfactants and electrochemical or chemical vapor deposition enables preferential metal deposition within recessed surface features known as superfilling. The same superconformal film growth processes account for the long-reported but poorly understood smoothing and brightening action provided by certain electroplating additives. Prototypical surfactant additives for superconformal Cu deposition from acid-based CuSO

Identifiants

pubmed: 37076974
doi: 10.1021/acs.accounts.2c00840
doi:

Types de publication

Journal Article

Langues

eng

Sous-ensembles de citation

IM

Pagination

1004-1017

Auteurs

Thomas P Moffat (TP)

Material and Measurement Laboratory, National Institute of Standards and Technology, 100 Bureau Drive, Gaithersburg, Maryland 20899, United States.

Trevor M Braun (TM)

Material and Measurement Laboratory, National Institute of Standards and Technology, 100 Bureau Drive, Gaithersburg, Maryland 20899, United States.

David Raciti (D)

Material and Measurement Laboratory, National Institute of Standards and Technology, 100 Bureau Drive, Gaithersburg, Maryland 20899, United States.

Daniel Josell (D)

Material and Measurement Laboratory, National Institute of Standards and Technology, 100 Bureau Drive, Gaithersburg, Maryland 20899, United States.

Classifications MeSH