Mid-infrared analogue polaritonic reversed Cherenkov radiation in natural anisotropic crystals.

Journal

Nature communications
ISSN: 2041-1723
Titre abrégé: Nat Commun
Pays: England
ID NLM: 101528555

Informations de publication

Date de publication:
03 May 2023
Historique:
received: 18 12 2022
accepted: 06 04 2023
medline: 4 5 2023
pubmed: 4 5 2023
entrez: 3 5 2023
Statut: epublish

Résumé

Cherenkov radiation (CR) excited by fast charges can serve as on-chip light sources with a nanoscale footprint and broad frequency range. The reversed CR, which usually occurs in media with the negative refractive index or negative group-velocity dispersion, is highly desired because it can effectively separate the radiated light from fast charges thanks to the obtuse radiation angle. However, reversed CR at the mid-infrared remains challenging due to the significant loss of conventional artificial structures. Here we observe mid-infrared analogue polaritonic reversed CR in a natural van der Waals (vdW) material (i.e., α-MoO

Identifiants

DOI: 10.1038/s41467-023-37923-w PMID: 37137873 PMC: PMC10156754
pubmed: 37137873
doi: 10.1038/s41467-023-37923-w
pii: 10.1038/s41467-023-37923-w
pmc: PMC10156754
doi:

Types de publication

Journal Article

Langues

eng

Sous-ensembles de citation

IM

Pagination

2532

Subventions

Organisme : National Natural Science Foundation of China (National Science Foundation of China)
ID : 51925203

Informations de copyright

© 2023. The Author(s).

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Auteurs

Xiangdong Guo (X)

CAS Key Laboratory of Nanophotonic Materials and Devices, CAS Key Laboratory of Standardization and Measurement for Nanotechnology, CAS Center for Excellence in Nanoscience, National Center for Nanoscience and Technology, Beijing, 100190, China.
Center of Materials Science and Optoelectronics Engineering, University of Chinese Academy of Sciences, Beijing, 100049, China.

Chenchen Wu (C)

CAS Key Laboratory of Nanophotonic Materials and Devices, CAS Key Laboratory of Standardization and Measurement for Nanotechnology, CAS Center for Excellence in Nanoscience, National Center for Nanoscience and Technology, Beijing, 100190, China.
Center of Materials Science and Optoelectronics Engineering, University of Chinese Academy of Sciences, Beijing, 100049, China.

Shu Zhang (S)

CAS Key Laboratory of Nanophotonic Materials and Devices, CAS Key Laboratory of Standardization and Measurement for Nanotechnology, CAS Center for Excellence in Nanoscience, National Center for Nanoscience and Technology, Beijing, 100190, China.
Center of Materials Science and Optoelectronics Engineering, University of Chinese Academy of Sciences, Beijing, 100049, China.

Debo Hu (D)

CAS Key Laboratory of Nanophotonic Materials and Devices, CAS Key Laboratory of Standardization and Measurement for Nanotechnology, CAS Center for Excellence in Nanoscience, National Center for Nanoscience and Technology, Beijing, 100190, China.
Center of Materials Science and Optoelectronics Engineering, University of Chinese Academy of Sciences, Beijing, 100049, China.
ORCID: 0000-0001-9432-1670

Shunping Zhang (S)

School of Physics and Technology, Center for Nanoscience and Nanotechnology, and Key Laboratory of Artificial Micro- and Nano-structures of Ministry of Education, Wuhan University, Wuhan, 430072, China.
ORCID: 0000-0002-8491-0903

Qiao Jiang (Q)

College of Physics, Chongqing University, Chongqing, 401331, China.

Xiaokang Dai (X)

CAS Key Laboratory of Nanophotonic Materials and Devices, CAS Key Laboratory of Standardization and Measurement for Nanotechnology, CAS Center for Excellence in Nanoscience, National Center for Nanoscience and Technology, Beijing, 100190, China.

Yu Duan (Y)

CAS Key Laboratory of Nanophotonic Materials and Devices, CAS Key Laboratory of Standardization and Measurement for Nanotechnology, CAS Center for Excellence in Nanoscience, National Center for Nanoscience and Technology, Beijing, 100190, China.

Xiaoxia Yang (X)

CAS Key Laboratory of Nanophotonic Materials and Devices, CAS Key Laboratory of Standardization and Measurement for Nanotechnology, CAS Center for Excellence in Nanoscience, National Center for Nanoscience and Technology, Beijing, 100190, China. yangxx@nanoctr.cn.
Center of Materials Science and Optoelectronics Engineering, University of Chinese Academy of Sciences, Beijing, 100049, China. yangxx@nanoctr.cn.
ORCID: 0000-0002-0670-053X

Zhipei Sun (Z)

Department of Electronics and Nanoengineering and QTF Centre of Excellence, Department of Applied Physics, Aalto University, Espoo, 02150, Finland.
ORCID: 0000-0002-9771-5293

Shuang Zhang (S)

Department of Physics, University of Hong Kong, Hong Kong, 999077, China.

Hongxing Xu (H)

School of Physics and Technology, Center for Nanoscience and Nanotechnology, and Key Laboratory of Artificial Micro- and Nano-structures of Ministry of Education, Wuhan University, Wuhan, 430072, China.
ORCID: 0000-0002-1718-8834

Qing Dai (Q)

CAS Key Laboratory of Nanophotonic Materials and Devices, CAS Key Laboratory of Standardization and Measurement for Nanotechnology, CAS Center for Excellence in Nanoscience, National Center for Nanoscience and Technology, Beijing, 100190, China. daiq@nanoctr.cn.
Center of Materials Science and Optoelectronics Engineering, University of Chinese Academy of Sciences, Beijing, 100049, China. daiq@nanoctr.cn.
ORCID: 0000-0002-1750-0867

Classifications MeSH