Hollow Ptychography: Toward Simultaneous 4D Scanning Transmission Electron Microscopy and Electron Energy Loss Spectroscopy.
4D-scanning transmitting electron microscopy (STEM)
electron energy loss spectroscopy (EELS)
electron microscopy
electron ptychography
pixelated detectors
Journal
Small (Weinheim an der Bergstrasse, Germany)
ISSN: 1613-6829
Titre abrégé: Small
Pays: Germany
ID NLM: 101235338
Informations de publication
Date de publication:
Sep 2023
Sep 2023
Historique:
revised:
13
04
2023
received:
26
12
2022
medline:
19
5
2023
pubmed:
19
5
2023
entrez:
19
5
2023
Statut:
ppublish
Résumé
With the recent development of high-acquisition-speed pixelated detectors, 4D scanning transmission electron microscopy (4D-STEM) is becoming routinely available in high-resolution electron microscopy. 4D-STEM acts as a "universal" method that provides local information on materials that is challenging to extract from bulk techniques. It extends conventional STEM imaging to include super-resolution techniques and to provide quantitative phase-based information, such as differential phase contrast, ptychography, or Bloch wave phase retrieval. However, an important missing factor is the chemical and bonding information provided by electron energy loss spectroscopy (EELS). 4D-STEM and EELS cannot currently be acquired simultaneously due to the overlapping geometry of the detectors. Here, the feasibility of modifying the detector geometry to overcome this challenge for bulk specimens is demonstrated, and the use of a partial or defective detector for ptycholgaphic structural imaging is explored. Results show that structural information beyond the diffraction-limit and chemical information from the material can be extracted together, resulting in simultaneous multi-modal measurements, adding the additional dimensions of spectral information to 4D datasets.
Identifiants
pubmed: 37203310
doi: 10.1002/smll.202208162
doi:
Types de publication
Journal Article
Langues
eng
Sous-ensembles de citation
IM
Pagination
e2208162Subventions
Organisme : U.S. Department of Energy, Office of Basic Energy Sciences
Organisme : Division of Materials Sciences and Engineering
ID : ERKCZ55
Organisme : Division of Materials Sciences and Engineering
ID : ERKCS89
Organisme : Center for Nanophase Materials Sciences
Organisme : Oak Ridge National Laboratory
Informations de copyright
© 2023 Wiley-VCH GmbH.
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