EXAFS
REXS
atomic occupancies
atomic positions
inserexs
resonant elastic X-ray scattering
thin films
Journal
Journal of applied crystallography
ISSN: 0021-8898
Titre abrégé: J Appl Crystallogr
Pays: United States
ID NLM: 9876190
Informations de publication
Date de publication:
01 Jun 2023
01 Jun 2023
Historique:
received:
07
12
2022
accepted:
07
03
2023
medline:
7
6
2023
pubmed:
7
6
2023
entrez:
7
6
2023
Statut:
epublish
Résumé
This paper presents
Identifiants
pubmed: 37284260
doi: 10.1107/S1600576723002212
pii: S1600576723002212
pmc: PMC10241054
doi:
Types de publication
Journal Article
Langues
eng
Pagination
854-859Informations de copyright
© Antonio Peña Corredor et al. 2023.
Références
Sci Adv. 2016 May 27;2(5):e1600192
pubmed: 27386545
ACS Omega. 2020 Aug 25;5(35):22614-22620
pubmed: 32923821
Nat Commun. 2018 Jan 12;9(1):178
pubmed: 29330508
Inorg Chem. 2013 Nov 18;52(22):13269-77
pubmed: 24180301
J Synchrotron Radiat. 2014 Nov;21(Pt 6):1247-51
pubmed: 25343791
J Phys Condens Matter. 2015 May 8;27(17):175001
pubmed: 25765433
Rep Prog Phys. 2013 May;76(5):056502
pubmed: 23563216
Chem Rev. 2001 Jun;101(6):1843-67
pubmed: 11710001
J Phys Condens Matter. 2009 Aug 26;21(34):345501
pubmed: 21715786
Sci Rep. 2019 Mar 12;9(1):4225
pubmed: 30862877