Multi-Level Resistive Al/Ga
RRAM
bilayer structure
gallium oxide
graphene oxide
multi-level storage
Journal
Nanomaterials (Basel, Switzerland)
ISSN: 2079-4991
Titre abrégé: Nanomaterials (Basel)
Pays: Switzerland
ID NLM: 101610216
Informations de publication
Date de publication:
13 Jun 2023
13 Jun 2023
Historique:
received:
05
05
2023
revised:
07
06
2023
accepted:
12
06
2023
medline:
27
6
2023
pubmed:
27
6
2023
entrez:
27
6
2023
Statut:
epublish
Résumé
Recently, resistive random access memory (RRAM) has been an outstanding candidate among various emerging nonvolatile memories for high-density storage and in-memory computing applications. However, traditional RRAM, which accommodates two states depending on applied voltage, cannot meet the high density requirement in the era of big data. Many research groups have demonstrated that RRAM possesses the potential for multi-level cells, which would overcome demands related to mass storage. Among numerous semiconductor materials, gallium oxide (a fourth-generation semiconductor material) is applied in the fields of optoelectronics, high-power resistive switching devices, and so on, due to its excellent transparent material properties and wide bandgap. In this study, we successfully demonstrate that Al/graphene oxide (GO)/Ga
Identifiants
pubmed: 37368281
pii: nano13121851
doi: 10.3390/nano13121851
pmc: PMC10302128
pii:
doi:
Types de publication
Journal Article
Langues
eng
Subventions
Organisme : Ministry of Science and Technology
ID : 108-2221-E-006-040-MY3
Organisme : Ministry of Science and Technology
ID : 111-2221-E-006-206
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