Deep learning for laser beam imprinting.


Journal

Optics express
ISSN: 1094-4087
Titre abrégé: Opt Express
Pays: United States
ID NLM: 101137103

Informations de publication

Date de publication:
05 Jun 2023
Historique:
medline: 29 6 2023
pubmed: 29 6 2023
entrez: 29 6 2023
Statut: ppublish

Résumé

Methods of ablation imprints in solid targets are widely used to characterize focused X-ray laser beams due to a remarkable dynamic range and resolving power. A detailed description of intense beam profiles is especially important in high-energy-density physics aiming at nonlinear phenomena. Complex interaction experiments require an enormous number of imprints to be created under all desired conditions making the analysis demanding and requiring a huge amount of human work. Here, for the first time, we present ablation imprinting methods assisted by deep learning approaches. Employing a multi-layer convolutional neural network (U-Net) trained on thousands of manually annotated ablation imprints in poly(methyl methacrylate), we characterize a focused beam of beamline FL24/FLASH2 at the Free-electron laser in Hamburg. The performance of the neural network is subject to a thorough benchmark test and comparison with experienced human analysts. Methods presented in this Paper pave the way towards a virtual analyst automatically processing experimental data from start to end.

Identifiants

pubmed: 37381380
pii: 531063
doi: 10.1364/OE.481776
doi:

Types de publication

Journal Article

Langues

eng

Sous-ensembles de citation

IM

Pagination

19703-19721

Auteurs

Classifications MeSH