Intrinsic-Strain Engineering by Dislocation Imprint in Bulk Ferroelectrics.
Journal
Physical review letters
ISSN: 1079-7114
Titre abrégé: Phys Rev Lett
Pays: United States
ID NLM: 0401141
Informations de publication
Date de publication:
07 Jul 2023
07 Jul 2023
Historique:
received:
21
11
2022
revised:
02
03
2023
accepted:
02
06
2023
medline:
21
7
2023
pubmed:
21
7
2023
entrez:
21
7
2023
Statut:
ppublish
Résumé
We report an intrinsic strain engineering, akin to thin filmlike approaches, via irreversible high-temperature plastic deformation of a tetragonal ferroelectric single-crystal BaTiO_{3}. Dislocations well-aligned along the [001] axis and associated strain fields in plane defined by the [110]/[1[over ¯]10] plane are introduced into the volume, thus nucleating only in-plane domain variants. By combining direct experimental observations and theoretical analyses, we reveal that domain instability and extrinsic degradation processes can both be mitigated during the aging and fatigue processes, and demonstrate that this requires careful strain tuning of the ratio of in-plane and out-of-plane domain variants. Our findings advance the understanding of structural defects that drive domain nucleation and instabilities in ferroic materials and are essential for mitigating device degradation.
Identifiants
pubmed: 37478420
doi: 10.1103/PhysRevLett.131.016801
doi:
Types de publication
Journal Article
Langues
eng
Sous-ensembles de citation
IM