Interlacing in Atomic Resolution Scanning Transmission Electron Microscopy.
high frame-rate STEM
interlacing
scanning transmission electron microscopy
strain precision
Journal
Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada
ISSN: 1435-8115
Titre abrégé: Microsc Microanal
Pays: England
ID NLM: 9712707
Informations de publication
Date de publication:
25 Jul 2023
25 Jul 2023
Historique:
received:
07
10
2022
revised:
27
03
2023
accepted:
24
04
2023
medline:
25
7
2023
pubmed:
25
7
2023
entrez:
25
7
2023
Statut:
ppublish
Résumé
Fast frame rates are desirable in scanning transmission electron microscopy for a number of reasons: controlling electron beam dose, capturing in situ events, or reducing the appearance of scan distortions. While several strategies exist for increasing frame rates, many impact image quality or require investment in advanced scan hardware. Here, we present an interlaced imaging approach to achieve minimal loss of image quality with faster frame rates that can be implemented on many existing scan controllers. We further demonstrate that our interlacing approach provides the best possible strain precision for a given electron dose compared with other contemporary approaches.
Identifiants
pubmed: 37488815
pii: 7191704
doi: 10.1093/micmic/ozad056
doi:
Types de publication
Journal Article
Langues
eng
Sous-ensembles de citation
IM
Pagination
1373-1379Informations de copyright
© The Author(s) 2023. Published by Oxford University Press on behalf of the Microscopy Society of America.
Déclaration de conflit d'intérêts
Conflict of Interest The authors declare that they have no competing interest.