Four-dimensional electron energy-loss spectroscopy.

Defect scattering Four-dimensional electron energy-loss spectroscopy (4D-EELS) Phonon dispersion Scanning transmission electron microscopy (STEM)

Journal

Ultramicroscopy
ISSN: 1879-2723
Titre abrégé: Ultramicroscopy
Pays: Netherlands
ID NLM: 7513702

Informations de publication

Date de publication:
Nov 2023
Historique:
received: 19 01 2023
revised: 20 06 2023
accepted: 25 07 2023
medline: 7 8 2023
pubmed: 7 8 2023
entrez: 6 8 2023
Statut: ppublish

Résumé

Recent advances in scanning transmission electron microscopy have enabled atomic-scale focused, coherent, and monochromatic electron probes, achieving nanoscale spatial resolution, meV energy resolution, sufficient momentum resolution, and a wide energy detection range in electron energy-loss spectroscopy (EELS). A four-dimensional EELS (4D-EELS) dataset can be recorded with a slot aperture selecting the specific momentum direction in the diffraction plane and the beam scanning in two spatial dimensions. In this paper, the basic principle of the 4D-EELS technique and a few examples of its application are presented. In addition to parallelly acquired dispersion with energy down to a lattice vibration scale, it can map the real space variation of any EELS spectrum features with a specific momentum transfer and energy loss to study various locally inhomogeneous scattering processes. Furthermore, simple mathematical combinations associating the spectra at different momenta are feasible from the 4D dataset, e.g., the efficient acquisition of a reliable electron magnetic circular dichroism (EMCD) signal is demonstrated. This 4D-EELS technique provides new opportunities to probe the local dispersion and related physical properties at the nanoscale.

Identifiants

pubmed: 37544270
pii: S0304-3991(23)00135-3
doi: 10.1016/j.ultramic.2023.113818
pii:
doi:

Types de publication

Journal Article

Langues

eng

Sous-ensembles de citation

IM

Pagination

113818

Informations de copyright

Copyright © 2023 Elsevier B.V. All rights reserved.

Déclaration de conflit d'intérêts

Declaration of Competing Interest The authors declare that they have no known competing financial interests or personal relationships that could have appeared to influence the work reported in this paper.

Auteurs

Mei Wu (M)

International Center for Quantum Materials, Peking University, Beijing 100871, China; Electron Microscopy Laboratory, School of Physics, Peking University, Beijing 100871, China.

Ruochen Shi (R)

International Center for Quantum Materials, Peking University, Beijing 100871, China; Electron Microscopy Laboratory, School of Physics, Peking University, Beijing 100871, China.

Ruishi Qi (R)

Department of Physics, University of California at Berkeley, Berkeley 94720, United States.

Yuehui Li (Y)

International Center for Quantum Materials, Peking University, Beijing 100871, China; Electron Microscopy Laboratory, School of Physics, Peking University, Beijing 100871, China.

Jinlong Du (J)

Electron Microscopy Laboratory, School of Physics, Peking University, Beijing 100871, China.

Peng Gao (P)

International Center for Quantum Materials, Peking University, Beijing 100871, China; Electron Microscopy Laboratory, School of Physics, Peking University, Beijing 100871, China; Collaborative Innovation Center of Quantum Matter, Beijing 100871, China; Interdisciplinary Institute of Light-Element Quantum Materials and Research Center for Light-Element Advanced Materials, Peking University, Beijing 100871, China. Electronic address: p-gao@pku.edu.cn.

Classifications MeSH