Formation of Paramagnetic Defects in the Synthesis of Silicon Carbide.
electron paramagnetic resonance (EPR)
photoluminescence
solid state quantum defects
Journal
Micromachines
ISSN: 2072-666X
Titre abrégé: Micromachines (Basel)
Pays: Switzerland
ID NLM: 101640903
Informations de publication
Date de publication:
28 Jul 2023
28 Jul 2023
Historique:
received:
09
05
2023
revised:
18
07
2023
accepted:
25
07
2023
medline:
26
8
2023
pubmed:
26
8
2023
entrez:
26
8
2023
Statut:
epublish
Résumé
Silicon carbide (SiC) is a very promising platform for quantum information processing, as it can host room temperature solid state defect quantum bits. These room temperature quantum bits are realized by paramagnetic silicon vacancy and divacancy defects in SiC that are typically introduced by irradiation techniques. However, irradiation techniques often introduce unwanted defects near the target quantum bit defects that can be detrimental for the operation of quantum bits. Here, we demonstrate that by adding aluminum precursor to the silicon and carbon sources, quantum bit defects are created in the synthesis of SiC without any post treatments. We optimized the synthesis parameters to maximize the paramagnetic defect concentrations-including already established defect quantum bits-monitored by electron spin resonance spectroscopy.
Identifiants
pubmed: 37630053
pii: mi14081517
doi: 10.3390/mi14081517
pmc: PMC10456762
pii:
doi:
Types de publication
Journal Article
Langues
eng
Subventions
Organisme : National Research, Development and Innovation Office
ID : 2022-2.1.1-NL-2022-00004
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