Determining the Projected Crystal Structure from Four-dimensional Scanning Transmission Electron Microscopy via the Scattering Matrix.
dynamical scattering
four-dimensional STEM
gradient descent
phase retrieval
projected structure determination
scattering matrix
Journal
Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada
ISSN: 1435-8115
Titre abrégé: Microsc Microanal
Pays: England
ID NLM: 9712707
Informations de publication
Date de publication:
09 Jun 2023
09 Jun 2023
Historique:
received:
05
10
2022
revised:
15
01
2023
accepted:
05
02
2023
medline:
26
9
2023
pubmed:
26
9
2023
entrez:
25
9
2023
Statut:
ppublish
Résumé
We present a gradient-descent-based approach to determining the projected electrostatic potential from four-dimensional scanning transmission electron microscopy measurements of a periodic, crystalline material even when dynamical scattering occurs. The method solves for the scattering matrix as an intermediate step, but overcomes the so-called truncation problem that limited previous scattering-matrix-based projected structure determination methods. Gradient descent is made efficient by using analytic expressions for the gradients. Through simulated case studies, we show that iteratively improving the scattering matrix determination can significantly improve the accuracy of the projected structure determination.
Identifiants
pubmed: 37749695
pii: 7165458
doi: 10.1093/micmic/ozad018
doi:
Types de publication
Journal Article
Langues
eng
Sous-ensembles de citation
IM
Pagination
967-982Informations de copyright
© The Author(s) 2023. Published by Oxford University Press on behalf of the Microscopy Society of America.
Déclaration de conflit d'intérêts
Conflict of Interest The authors declare that they have no competing interest.