On-demand multiplexed vortex beams for terahertz polarization detection based on metasurfaces.


Journal

Nanoscale
ISSN: 2040-3372
Titre abrégé: Nanoscale
Pays: England
ID NLM: 101525249

Informations de publication

Date de publication:
02 Nov 2023
Historique:
medline: 19 10 2023
pubmed: 19 10 2023
entrez: 19 10 2023
Statut: epublish

Résumé

The manipulation of polarization states is crucial for tailoring light-matter interactions and has great applications in fundamental science. Nevertheless, conventional polarization measurement approaches are extremely challenging to determine the polarization state of incident terahertz (THz) beams. The combination of metasurfaces and inhomogeneous vector vortex beams (VVBs) provides a new solution for integrated polarization-related functional devices. Herein, a general design strategy for spin-multiplexing all-silicon metasurfaces is presented and demonstrated in THz polarization detection. The employment of basic building blocks with a high aspect ratio (AR) imparts a greater degree of freedom for generating vector beams, and those basic blocks are subsequently utilized to explore the visualized polarization state. With the assistance of a THz near-field scanning system, we evaluate the capability of reconstructing the incident polarization state from the longitudinal polarization component multiplexed by vortex beams with tight focusing characteristics. Not only that, we also utilize the polarization with dynamically varying behavior as the illumination method to elucidate the evolution trend of the polarization state under a single snapshot and establish a visualized parametric model. This work paves the way to realize ultra-compact THz polarization detection-related devices for future applications in remote sensing, high-resolution imaging, and communications.

Identifiants

pubmed: 37855083
doi: 10.1039/d3nr03905f
doi:

Types de publication

Journal Article

Langues

eng

Sous-ensembles de citation

IM

Pagination

17184-17197

Auteurs

Wenhui Xu (W)

Key Laboratory of Opto-Electronics Information Technology (Tianjin University), Ministry of Education, School of Precision Instruments and Opto-Electronics Engineering, Tianjin University, Tianjin 300072, China. xh_931119@tju.edu.cn.

Hui Li (H)

Key Laboratory of Opto-Electronics Information Technology (Tianjin University), Ministry of Education, School of Precision Instruments and Opto-Electronics Engineering, Tianjin University, Tianjin 300072, China. xh_931119@tju.edu.cn.

Shouxin Duan (S)

Department of Physics, School of Physics and Materials Science, Nanchang University, Nanchang 330031, China. shenyun@ncu.edu.cn.

Hang Xu (H)

Key Laboratory of Opto-Electronics Information Technology (Tianjin University), Ministry of Education, School of Precision Instruments and Opto-Electronics Engineering, Tianjin University, Tianjin 300072, China. xh_931119@tju.edu.cn.

Chenglong Zheng (C)

Key Laboratory of Material Physics, Ministry of Education, School of Physics and Microelectronics, Zhengzhou University, Zhengzhou 450052, China.

Jie Li (J)

Information Materials and Device Applications Key Laboratory of Sichuan Provincial Universities, Chengdu University of Information Technology, Chengdu 610225, China.

Chunyu Song (C)

Key Laboratory of Opto-Electronics Information Technology (Tianjin University), Ministry of Education, School of Precision Instruments and Opto-Electronics Engineering, Tianjin University, Tianjin 300072, China. xh_931119@tju.edu.cn.

Yating Zhang (Y)

Key Laboratory of Opto-Electronics Information Technology (Tianjin University), Ministry of Education, School of Precision Instruments and Opto-Electronics Engineering, Tianjin University, Tianjin 300072, China. xh_931119@tju.edu.cn.

Yun Shen (Y)

Department of Physics, School of Physics and Materials Science, Nanchang University, Nanchang 330031, China. shenyun@ncu.edu.cn.

Jianquan Yao (J)

Key Laboratory of Opto-Electronics Information Technology (Tianjin University), Ministry of Education, School of Precision Instruments and Opto-Electronics Engineering, Tianjin University, Tianjin 300072, China. xh_931119@tju.edu.cn.

Classifications MeSH