High Isolation, Double-Clamped, Magnetoelectric Microelectromechanical Resonator Magnetometer.

aluminum nitride iron cobalt hafnium magnetoelectric magnetometer magnetostriction mems

Journal

Sensors (Basel, Switzerland)
ISSN: 1424-8220
Titre abrégé: Sensors (Basel)
Pays: Switzerland
ID NLM: 101204366

Informations de publication

Date de publication:
21 Oct 2023
Historique:
received: 08 08 2023
revised: 10 10 2023
accepted: 16 10 2023
medline: 28 10 2023
pubmed: 28 10 2023
entrez: 28 10 2023
Statut: epublish

Résumé

Magnetoelectric (ME)-based magnetometers have garnered much attention as they boast ultra-low-power systems with a small form factor and limit of detection in the tens of picotesla. The highly sensitive and low-power electric readout from the ME sensor makes them attractive for near DC and low-frequency AC magnetic fields as platforms for continuous magnetic signature monitoring. Among multiple configurations of the current ME magnetic sensors, most rely on exploiting the mechanically resonant characteristics of a released ME microelectromechanical system (MEMS) in a heterostructure device. Through optimizing the resonant device configuration, we design and fabricate a fixed-fixed resonant beam structure with high isolation compared to previous designs operating at ~800 nW of power comprised of piezoelectric aluminum nitride (AlN) and magnetostrictive (Co

Identifiants

pubmed: 37896719
pii: s23208626
doi: 10.3390/s23208626
pmc: PMC10610584
pii:
doi:

Types de publication

Journal Article

Langues

eng

Sous-ensembles de citation

IM

Subventions

Organisme : US Office of Naval Research
ID : N/A
Organisme : US Naval Research Laboratory
ID : N/A
Organisme : American Society for Engineering Education
ID : N/A
Organisme : US Defense Advanced Research Projects Agency (DARPA)
ID : HR0011-20-C-0098
Organisme : National Science Foundation Graduate Research Fellowship (NSF-GFRP)
ID : DGE-1845298
Organisme : National Science Foundation National Nanotechnology Coordinated Infrastructure Program
ID : NNCI-2025608

Références

Sci Rep. 2021 Mar 5;11(1):5269
pubmed: 33674690
Sensors (Basel). 2021 Aug 18;21(16):
pubmed: 34451010
Phys Rev Appl. 2019 Mar;11(3):
pubmed: 33244511
Nanoscale Res Lett. 2021 Jan 26;16(1):16
pubmed: 33496852
Materials (Basel). 2019 Jul 13;12(14):
pubmed: 31337062

Auteurs

Thomas Mion (T)

US Naval Research Laboratory, American Society for Engineering Education Postdoc, Washington, DC 02375, USA.

Michael J D'Agati (MJ)

Electrical and Systems Engineering Department, University of Pennsylvania, Philadelphia, PA 19104, USA.

Sydney Sofronici (S)

Electrical and Systems Engineering Department, University of Pennsylvania, Philadelphia, PA 19104, USA.

Konrad Bussmann (K)

US Naval Research Laboratory, Materials Science and Technology Division, Washington, DC 02375, USA.

Margo Staruch (M)

US Naval Research Laboratory, Materials Science and Technology Division, Washington, DC 02375, USA.

Jason L Kost (JL)

US Naval Research Laboratory, Acoustics Division, Washington, DC 02375, USA.

Kevin Co (K)

Laboratoire Structures, Propriétés et Modélisation des Solides, CentraleSupélec, Université Paris-Saclay, 91190 Gif-sur-Yvette, France.

Roy H Olsson (RH)

Electrical and Systems Engineering Department, University of Pennsylvania, Philadelphia, PA 19104, USA.

Peter Finkel (P)

US Naval Research Laboratory, Materials Science and Technology Division, Washington, DC 02375, USA.

Classifications MeSH