Analysis of Strain and Defects in Tellurium-WSe

WSe2 defects moiré superlattices scanning nanodiffraction strain tellurium

Journal

ACS nano
ISSN: 1936-086X
Titre abrégé: ACS Nano
Pays: United States
ID NLM: 101313589

Informations de publication

Date de publication:
28 Nov 2023
Historique:
medline: 13 11 2023
pubmed: 13 11 2023
entrez: 13 11 2023
Statut: ppublish

Résumé

In recent years, there has been an increasing focus on 2D nongraphene materials that range from insulators to semiconductors to metals. As a single-elemental van der Waals semiconductor, tellurium (Te) has captivating anisotropic physical properties. Recent work demonstrated growth of ultrathin Te on WSe

Identifiants

pubmed: 37956410
doi: 10.1021/acsnano.3c04283
pmc: PMC10690779
doi:

Types de publication

Journal Article

Langues

eng

Sous-ensembles de citation

IM

Pagination

22326-22333

Références

Nanoscale. 2020 Jan 23;12(3):1994-2001
pubmed: 31912077
Open Res Eur. 2021 May 21;1:24
pubmed: 37645137
Nat Commun. 2022 Jan 10;13(1):70
pubmed: 35013349
Front Chem. 2019 Nov 12;7:738
pubmed: 31781536
ACS Nano. 2015 Dec 22;9(12):11509-39
pubmed: 26544756
Nano Lett. 2017 Aug 9;17(8):4619-4623
pubmed: 28657748
Ultramicroscopy. 2020 Feb;209:112890
pubmed: 31743883
J Phys Chem C Nanomater Interfaces. 2019 Jan 10;123(1):841-847
pubmed: 30774745
Nat Nanotechnol. 2020 Jul;15(7):580-584
pubmed: 32572229
Phys Rev Lett. 2013 Apr 26;110(17):176401
pubmed: 23679748
Chem Soc Rev. 2018 Oct 1;47(19):7203-7212
pubmed: 30118130
J Am Chem Soc. 2018 Jan 17;140(2):550-553
pubmed: 29268604
Nano Lett. 2015 Mar 11;15(3):1468-75
pubmed: 25647719
Microsc Microanal. 2019 Jun;25(3):563-582
pubmed: 31084643
Phys Rev B Condens Matter. 1990 Mar 15;41(9):5500-5508
pubmed: 9994429
Nanoscale. 2020 Jun 21;12(23):12613-12622
pubmed: 32510097
Nanoscale. 2019 Nov 21;11(45):21622-21678
pubmed: 31702753
Nano Lett. 2018 Jun 13;18(6):3746-3751
pubmed: 29775315
Proc Natl Acad Sci U S A. 2018 Jul 17;115(29):7473-7478
pubmed: 29970422
Microsc Microanal. 2021 Aug;27(4):712-743
pubmed: 34018475
ACS Nano. 2019 Sep 24;13(9):9781-9810
pubmed: 31430131
ACS Nano. 2021 Feb 23;15(2):2869-2879
pubmed: 33476130
Nat Commun. 2016 Jan 11;7:10287
pubmed: 26751919
ACS Nano. 2021 Apr 27;15(4):5944-5958
pubmed: 33769797
Sci Rep. 2016 Feb 12;6:21516
pubmed: 26867496
Nat Commun. 2021 Feb 26;12(1):1290
pubmed: 33637704

Auteurs

Bengisu Sari (B)

Department of Materials Science and Engineering, University of California Berkeley, Berkeley, California 94720, United States.
The National Center for Electron Microscopy, Molecular Foundry, Berkeley, California 94720, United States.
Materials Science Division, Lawrence Berkeley National Laboratory, Berkeley, California 94720-8099, United States.

Steven E Zeltmann (SE)

Department of Materials Science and Engineering, University of California Berkeley, Berkeley, California 94720, United States.

Chunsong Zhao (C)

Department of Materials Science and Engineering, University of California Berkeley, Berkeley, California 94720, United States.
Materials Science Division, Lawrence Berkeley National Laboratory, Berkeley, California 94720-8099, United States.
Department of Electrical Engineering and Computer Sciences, University of California Berkeley, Berkeley, California 94720, United States.

Philipp M Pelz (PM)

Institute of Micro- and Nanostructure Research, Center for Nanoanalysis and Electron Microscopy, Interdisciplinary Center for Nanostructured Films, Friedrich-Alexander-Universitat Erlangen-Nurnberg, Erlangen 91058, Germany.

Ali Javey (A)

Materials Science Division, Lawrence Berkeley National Laboratory, Berkeley, California 94720-8099, United States.
Department of Electrical Engineering and Computer Sciences, University of California Berkeley, Berkeley, California 94720, United States.

Andrew M Minor (AM)

Department of Materials Science and Engineering, University of California Berkeley, Berkeley, California 94720, United States.
The National Center for Electron Microscopy, Molecular Foundry, Berkeley, California 94720, United States.

Colin Ophus (C)

The National Center for Electron Microscopy, Molecular Foundry, Berkeley, California 94720, United States.

Mary C Scott (MC)

Department of Materials Science and Engineering, University of California Berkeley, Berkeley, California 94720, United States.
The National Center for Electron Microscopy, Molecular Foundry, Berkeley, California 94720, United States.
Materials Science Division, Lawrence Berkeley National Laboratory, Berkeley, California 94720-8099, United States.

Classifications MeSH