Mid-infrared supermirrors with finesse exceeding 400 000.


Journal

Nature communications
ISSN: 2041-1723
Titre abrégé: Nat Commun
Pays: England
ID NLM: 101528555

Informations de publication

Date de publication:
06 Dec 2023
Historique:
received: 21 10 2022
accepted: 03 11 2023
medline: 7 12 2023
pubmed: 7 12 2023
entrez: 6 12 2023
Statut: epublish

Résumé

For trace gas sensing and precision spectroscopy, optical cavities incorporating low-loss mirrors are indispensable for path length and optical intensity enhancement. Optical interference coatings in the visible and near-infrared (NIR) spectral regions have achieved total optical losses below 2 parts per million (ppm), enabling a cavity finesse in excess of 1 million. However, such advancements have been lacking in the mid-infrared (MIR), despite substantial scientific interest. Here, we demonstrate a significant breakthrough in high-performance MIR mirrors, reporting substrate-transferred single-crystal interference coatings capable of cavity finesse values from 200 000 to 400 000 near 4.5 µm, with excess optical losses (scatter and absorption) below 5 ppm. In a first proof-of-concept demonstration, we achieve the lowest noise-equivalent absorption in a linear cavity ring-down spectrometer normalized by cavity length. This substantial improvement in performance will unlock a rich variety of MIR applications for atmospheric transport and environmental sciences, detection of fugitive emissions, process gas monitoring, breath-gas analysis, and verification of biogenic fuels and plastics.

Identifiants

pubmed: 38057298
doi: 10.1038/s41467-023-43367-z
pii: 10.1038/s41467-023-43367-z
pmc: PMC10700499
doi:

Types de publication

Journal Article

Langues

eng

Sous-ensembles de citation

IM

Pagination

7846

Informations de copyright

© 2023. The Author(s).

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Auteurs

Gar-Wing Truong (GW)

Thorlabs Crystalline Solutions, 114 E Haley St., Suite G, Santa Barbara, CA, 93101, USA. garwing@thorlabs.com.

Lukas W Perner (LW)

Christian Doppler Laboratory for Mid-IR Spectroscopy and Semiconductor Optics, Faculty Center for Nano Structure Research, Faculty of Physics, University of Vienna, Boltzmanngasse 5, A-1090, Vienna, Austria.
Vienna Doctoral School in Physics, University of Vienna, Boltzmanngasse 5, A-1090, Vienna, Austria.

D Michelle Bailey (DM)

National Institute of Standards and Technology, 100 Bureau Drive, Gaithersburg, MD, 20899, USA.

Georg Winkler (G)

Christian Doppler Laboratory for Mid-IR Spectroscopy and Semiconductor Optics, Faculty Center for Nano Structure Research, Faculty of Physics, University of Vienna, Boltzmanngasse 5, A-1090, Vienna, Austria.

Seth B Cataño-Lopez (SB)

Thorlabs Crystalline Solutions, 114 E Haley St., Suite G, Santa Barbara, CA, 93101, USA.

Valentin J Wittwer (VJ)

Laboratoire Temps-Fréquence, Institut de Physique, Université de Neuchâtel, Avenue de Bellevaux 51, 2000, Neuchâtel, Switzerland.

Thomas Südmeyer (T)

Laboratoire Temps-Fréquence, Institut de Physique, Université de Neuchâtel, Avenue de Bellevaux 51, 2000, Neuchâtel, Switzerland.

Catherine Nguyen (C)

Thorlabs Crystalline Solutions, 114 E Haley St., Suite G, Santa Barbara, CA, 93101, USA.

David Follman (D)

Thorlabs Crystalline Solutions, 114 E Haley St., Suite G, Santa Barbara, CA, 93101, USA.

Adam J Fleisher (AJ)

National Institute of Standards and Technology, 100 Bureau Drive, Gaithersburg, MD, 20899, USA.

Oliver H Heckl (OH)

Christian Doppler Laboratory for Mid-IR Spectroscopy and Semiconductor Optics, Faculty Center for Nano Structure Research, Faculty of Physics, University of Vienna, Boltzmanngasse 5, A-1090, Vienna, Austria. oliver.heckl@univie.ac.at.

Garrett D Cole (GD)

Thorlabs Crystalline Solutions, 114 E Haley St., Suite G, Santa Barbara, CA, 93101, USA.

Classifications MeSH