Measurement of the 2νββ Decay Half-Life of ^{82}Se with the Global CUPID-0 Background Model.
Journal
Physical review letters
ISSN: 1079-7114
Titre abrégé: Phys Rev Lett
Pays: United States
ID NLM: 0401141
Informations de publication
Date de publication:
01 Dec 2023
01 Dec 2023
Historique:
received:
09
06
2023
revised:
31
07
2023
accepted:
31
10
2023
medline:
16
12
2023
pubmed:
16
12
2023
entrez:
15
12
2023
Statut:
ppublish
Résumé
We report on the results obtained with the global CUPID-0 background model, which combines the data collected in the two measurement campaigns for a total exposure of 8.82 kg×yr of ^{82}Se. We identify with improved precision the background sources within the 3 MeV energy region, where neutrinoless double β decay of ^{82}Se and ^{100}Mo is expected, making more solid the foundations for the background budget of the next-generation CUPID experiment. Relying on the excellent data reconstruction, we measure the two-neutrino double β-decay half-life of ^{82}Se with unprecedented accuracy: T_{1/2}^{2ν}=[8.69±0.05(stat)_{-0.06}^{+0.09}(syst)]×10^{19} yr.
Identifiants
pubmed: 38101385
doi: 10.1103/PhysRevLett.131.222501
doi:
Types de publication
Journal Article
Langues
eng
Sous-ensembles de citation
IM