Metalens for Accelerated Optoelectronic Edge Detection under Ambient Illumination.

Edge detection Metalens Polarization multiplexing Spatial differentiation

Journal

Nano letters
ISSN: 1530-6992
Titre abrégé: Nano Lett
Pays: United States
ID NLM: 101088070

Informations de publication

Date de publication:
18 Dec 2023
Historique:
medline: 18 12 2023
pubmed: 18 12 2023
entrez: 18 12 2023
Statut: aheadofprint

Résumé

Analog systems may allow image processing, such as edge detection, with low computational power. However, most demonstrated analog systems, based on either conventional 4-

Identifiants

DOI: 10.1021/acs.nanolett.3c04112 PMID: 38109180
pubmed: 38109180
doi: 10.1021/acs.nanolett.3c04112
doi:

Types de publication

Journal Article

Langues

eng

Sous-ensembles de citation

IM

Auteurs

Shuai Wang (S)

State Key Laboratory for Precision Measurement Technology and Instruments, Department of Precision Instrument, Tsinghua University, Beijing 100084, China.
Qingdao Innovation and Development Center, Harbin Engineering University, Qingdao 26600, China.
ORCID: 0000-0001-9987-440X

Liu Li (L)

State Key Laboratory for Precision Measurement Technology and Instruments, Department of Precision Instrument, Tsinghua University, Beijing 100084, China.

Shun Wen (S)

State Key Laboratory for Precision Measurement Technology and Instruments, Department of Precision Instrument, Tsinghua University, Beijing 100084, China.

Ruiqi Liang (R)

State Key Laboratory for Precision Measurement Technology and Instruments, Department of Precision Instrument, Tsinghua University, Beijing 100084, China.

Yaxi Liu (Y)

State Key Laboratory for Precision Measurement Technology and Instruments, Department of Precision Instrument, Tsinghua University, Beijing 100084, China.

Feng Zhao (F)

State Key Laboratory for Precision Measurement Technology and Instruments, Department of Precision Instrument, Tsinghua University, Beijing 100084, China.

Yuanmu Yang (Y)

State Key Laboratory for Precision Measurement Technology and Instruments, Department of Precision Instrument, Tsinghua University, Beijing 100084, China.
ORCID: 0000-0002-5264-0822

Classifications MeSH