Implementation of a dual-phase grating interferometer for multi-scale characterization of building materials by tunable dark-field imaging.
Journal
Scientific reports
ISSN: 2045-2322
Titre abrégé: Sci Rep
Pays: England
ID NLM: 101563288
Informations de publication
Date de publication:
03 Jan 2024
03 Jan 2024
Historique:
received:
19
09
2023
accepted:
19
12
2023
medline:
4
1
2024
pubmed:
4
1
2024
entrez:
3
1
2024
Statut:
epublish
Résumé
The multi-scale characterization of building materials is necessary to understand complex mechanical processes, with the goal of developing new more sustainable materials. To that end, imaging methods are often used in materials science to characterize the microscale. However, these methods compromise the volume of interest to achieve a higher resolution. Dark-field (DF) contrast imaging is being investigated to characterize building materials in length scales smaller than the resolution of the imaging system, allowing a direct comparison of features in the nano-scale range and overcoming the scale limitations of the established characterization methods. This work extends the implementation of a dual-phase X-ray grating interferometer (DP-XGI) for DF imaging in a lab-based setup. The interferometer was developed to operate at two different design energies of 22.0 keV and 40.8 keV and was designed to characterize nanoscale-size features in millimeter-sized material samples. The good performance of the interferometer in the low energy range (LER) is demonstrated by the DF retrieval of natural wood samples. In addition, a high energy range (HER) configuration is proposed, resulting in higher mean visibility and good sensitivity over a wider range of correlation lengths in the nanoscale range. Its potential for the characterization of mineral building materials is illustrated by the DF imaging of a Ketton limestone. Additionally, the capability of the DP-XGI to differentiate features in the nanoscale range is proven with the dark-field of Silica nanoparticles at different correlation lengths of calibrated sizes of 106 nm, 261 nm, and 507 nm.
Identifiants
pubmed: 38172504
doi: 10.1038/s41598-023-50424-6
pii: 10.1038/s41598-023-50424-6
doi:
Types de publication
Journal Article
Langues
eng
Sous-ensembles de citation
IM
Pagination
384Subventions
Organisme : Fonds Wetenschappelijk Onderzoek (FWO)
ID : 3179I12018
Organisme : Fonds Wetenschappelijk Onderzoek (FWO)
ID : 3179I12018
Organisme : Fonds Wetenschappelijk Onderzoek (FWO)
ID : 3179I12018
Organisme : Schweizerischer Nationalfonds zur Förderung der Wissenschaftlichen Forschung
ID : 159263
Organisme : Provincie Oost-Vlaanderen (Smart*Light)
ID : 0386
Informations de copyright
© 2024. The Author(s).
Références
Lothenbach, B., Scrivener, K. & Snellings, R. A practical guide to microstructural analysis of cementitious materials (CRC Press, 2016).
Rübner, K. & Hoffmann, D. Characterization of mineral building materials by mercury-intrusion porosimetry. Part. Part. Syst. Charact. 23, 20–28 (2006).
doi: 10.1002/ppsc.200601008
Cnudde, V., Cwirzen, A., Masschaele, B. & Jacobs, P. Porosity and microstructure characterization of building stones and concretes. Eng. Geol. 103, 76–83. https://doi.org/10.1016/j.enggeo.2008.06.014 (2009).
doi: 10.1016/j.enggeo.2008.06.014
Harding, D. P. Mineral identification using a scanning electron microscope. Min. Metall. Explor. 19, 215–219. https://doi.org/10.1007/BF03403272 (2002).
doi: 10.1007/BF03403272
Chalmers, G. R., Bustin, R. M. & Power, I. M. Characterization of gas shale pore systems by porosimetry, pycnometry, surface area, and field emission scanning electron microscopy/transmission electron microscopy image analyses: Examples from the Barnett, Woodford, Haynesville, Marcellus, and Doig units. AAPG Bull. 96, 1099–1119 (2012).
doi: 10.1306/10171111052
Desbois, G., Urai, J. & Kukla, P. Morphology of the pore space in claystones-evidence from bib/fib ion beam sectioning and cryo-sem observations. eEarth Discuss. 4, 1–19 (2009).
doi: 10.5194/eed-4-1-2009
Tian, S. et al. A method for automatic shale porosity quantification using an edge-threshold automatic processing (ETAP) technique. Fuel 304, 121319. https://doi.org/10.1016/j.fuel.2021.121319 (2021).
doi: 10.1016/j.fuel.2021.121319
Liu, Q. et al. Pore network characterization of shale reservoirs through state-of-the-art X-ray computed tomography: A review. Gas Sci. Eng. 113, 204967. https://doi.org/10.1016/j.jgsce.2023.204967 (2023).
doi: 10.1016/j.jgsce.2023.204967
Kibleur, P. et al. Microscopic deformations in MDF swelling: A unique 4D-CT characterization. Mater. Struct. 55, 206 (2022).
doi: 10.1617/s11527-022-02044-1
Blykers, B. K. et al. Exploration of the X-ray dark-field signal in mineral building materials. J. Imaging 8, 282 (2022).
doi: 10.3390/jimaging8100282
Momose, A. et al. Demonstration of X-ray Talbot interferometry. Jpn. J. Appl. Phys. 42, L866 (2003).
doi: 10.1143/JJAP.42.L866
Pfeiffer, F. et al. Hard-X-ray dark-field imaging using a grating interferometer. Nat. Mater. 7, 134–137. https://doi.org/10.1038/nmat2096 (2008).
doi: 10.1038/nmat2096
Blykers, B. K. et al. Tunable X-ray dark-field imaging for sub-resolution feature size quantification in porous media. Sci. Rep. 11, 1–14 (2021).
doi: 10.1038/s41598-021-97915-y
Vila-Comamala, J. et al. High sensitivity X-ray phase contrast imaging by laboratory grating-based interferometry at high Talbot order geometry. Opt. Express 29, 2049–2064 (2021).
doi: 10.1364/OE.414174
Pfeiffer, F., Weitkamp, T., Bunk, O. & David, C. Phase retrieval and differential phase-contrast imaging with low-brilliance X-ray sources. Nat. Phys. 2, 258–261. https://doi.org/10.1038/nphys265 (2006).
doi: 10.1038/nphys265
Kagias, M., Wang, Z., Jefimovs, K. & Stampanoni, M. Dual phase grating interferometer for tunable dark-field sensitivity. Appl. Phys. Lett. 110, 014105. https://doi.org/10.1063/1.4973520 (2017).
doi: 10.1063/1.4973520
Miao, H. et al. A universal moiré effect and application in X-ray phase-contrast imaging. Nat. Phys. 12, 830–834. https://doi.org/10.1038/nphys3734 (2016).
doi: 10.1038/nphys3734
Weitkamp, T., David, C., Kottler, C., Bunk, O. & Pfeiffer, F. Tomography with grating interferometers at low-brilliance sources. In Developments in X-ray tomography V Vol. 6318, 63180S. https://doi.org/10.1117/12.683851 (2006).
Organista, C. et al. Optimization of the visibility of a tunable dual-phase X-ray grating interferometer. Opt. Continuum 2, 232–248. https://doi.org/10.1364/OPTCON.478294 (2023).
doi: 10.1364/OPTCON.478294
Tang, R. et al. Detailed analysis of the interference patterns measured in lab-based X-ray dual-phase grating interferometry through wave propagation simulation. Opt. Express 31, 1677–1691. https://doi.org/10.1364/OE.477964 (2023).
doi: 10.1364/OE.477964
Paganin, D. Coherent X-ray optics No. 6 (Oxford University Press, 2006).
Lynch, S. K. et al. Interpretation of dark-field contrast and particle-size selectivity in grating interferometers. Appl. Opt. 50, 4310–4319 (2011).
doi: 10.1364/AO.50.004310
Bech, M. et al. Hard X-ray phase-contrast imaging with the compact light source based on inverse Compton X-rays. J. Synchrotron Radiat. 16, 43–47 (2009).
doi: 10.1107/S090904950803464X
Strobl, M. General solution for quantitative dark-field contrast imaging with grating interferometers. Sci. Rep. 4, 7243. https://doi.org/10.1038/srep07243 (2014).
doi: 10.1038/srep07243
Yan, A., Wu, X. & Liu, H. Predicting fringe visibility in dual-phase grating interferometry with polychromatic X-ray sources. J. X-ray Sci. Technol. 28, 1055–1067 (2020).
Yan, A., Wu, X. & Liu, H. Quantitative theory of X-ray interferometers based on dual phase grating: fringe period and visibility. Opt. Express 26, 23142. https://doi.org/10.1364/oe.26.023142 (2018).
doi: 10.1364/oe.26.023142
Dhaene, J. et al. A realistic projection simulator for laboratory based X-ray micro-CT. Nucl. Instrum. Methods Phys. Res. Sect. B 342, 170–178. https://doi.org/10.1016/j.nimb.2014.09.033 (2015).
doi: 10.1016/j.nimb.2014.09.033
Nesterets, Y. I. On the origins of decoherence and extinction contrast in phase-contrast imaging. Opt. Commun. 281, 533–542. https://doi.org/10.1016/j.optcom.2007.10.025 (2008).
doi: 10.1016/j.optcom.2007.10.025
Yashiro, W., Terui, Y., Kawabata, K. & Momose, A. On the origin of visibility contrast in X-ray Talbot interferometry. Opt. Express 18, 16890. https://doi.org/10.1364/oe.18.016890 (2010).
doi: 10.1364/oe.18.016890
Pandeshwar, A., Kagias, M., Wang, Z. & Stampanoni, M. Modeling of beam hardening effects in a dual-phase X-ray grating interferometer for quantitative dark-field imaging. Opt. Express 28, 19187. https://doi.org/10.1364/oe.395237 (2020).
doi: 10.1364/oe.395237
Harti, R. P. et al. Sub-pixel correlation length neutron imaging: Spatially resolved scattering information of microstructures on a macroscopic scale. Sci. Rep. 7, 44588. https://doi.org/10.1038/srep44588 (2017).
doi: 10.1038/srep44588
Prade, F., Yaroshenko, A., Herzen, J. & Pfeiffer, F. Short-range order in mesoscale systems probed by X-ray grating interferometry. Europhys. Lett. 112, 68002 (2016).
doi: 10.1209/0295-5075/112/68002
Masschaele, B. et al. UGCT: New X-ray radiography and tomography facility. Nucl. Instrum. Methods Phys. Res. Sect. A 580, 266–269 (2007).
doi: 10.1016/j.nima.2007.05.099
Jefimovs, K. et al. High-aspect ratio silicon structures by displacement Talbot lithography and Bosch etching. In (ed. Hohle, C. K.) Advances in Patterning Materials and Processes XXXIV Vol. 10146, 101460L, https://doi.org/10.1117/12.2258007. International Society for Optics and Photonics (SPIE, 2017).
Shi, Z., Jefimovs, K., Romano, L. & Stampanoni, M. Optimization of displacement Talbot lithography for fabrication of uniform high aspect ratio gratings. Jpn. J. Appl. Phys. 60, SCCA01. https://doi.org/10.35848/1347-4065/abe202 (2021).
doi: 10.35848/1347-4065/abe202
Shi, Z., Jefimovs, K., Romano, L. & Stampanoni, M. Towards the fabrication of high-aspect-ratio silicon gratings by deep reactive ion etching. Micromachines 11, 864. https://doi.org/10.3390/mi11090864 (2020).
doi: 10.3390/mi11090864
Josell, D. et al. Pushing the limits of bottom-up gold filling for X-ray grating interferometry. J. Electrochem. Soc. 167, 132504. https://doi.org/10.1149/1945-7111/abba63 (2020).
doi: 10.1149/1945-7111/abba63
Josell, D. et al. Bottom-up gold filling in new geometries and yet higher aspect ratio gratings for hard X-ray interferometry. J. Electrochem. Soc. 168, 082508. https://doi.org/10.1149/1945-7111/ac1d7e (2021).
doi: 10.1149/1945-7111/ac1d7e
Josell, D. & Moffat, T. P. Bottom-up filling of damascene trenches with gold in a sulfite electrolyte. J. Electrochem. Soc. 166, D3022. https://doi.org/10.1149/2.0041901jes (2019).
doi: 10.1149/2.0041901jes
Ambrozik, S., Moffat, T. P., Zhang, C., Miao, H. & Josell, D. Bottom-up gold filling of high aspect ratio trenches. J. Electrochem. Soc. 166, D443. https://doi.org/10.1149/2.0891910jes (2019).
doi: 10.1149/2.0891910jes
Josell, D., Williams, M. E., Ambrozik, S., Zhang, C. & Moffat, T. P. Accelerated bottom-up gold filling of metallized trenches. J. Electrochem. Soc. 166, D487. https://doi.org/10.1149/2.0261912jes (2019).
doi: 10.1149/2.0261912jes
Josell, D. et al. Exploring the limits of bottom-up gold filling to fabricate diffraction gratings. J. Electrochem. Soc. 166, D898. https://doi.org/10.1149/2.1131915jes (2019).
doi: 10.1149/2.1131915jes
Josell, D., Osborn, W. A., Williams, M. E. & Miao, H. Robust bottom-up gold filling of deep trenches and gratings. J. Electrochem. Soc. 169, 032509. https://doi.org/10.1149/1945-7111/ac5c0b (2022).
doi: 10.1149/1945-7111/ac5c0b
Shi, Z. et al. Fabrication of a fractal pattern device for focus characterizations of X-ray imaging systems by Si deep reactive ion etching and bottom-up Au electroplating. Appl. Opt. 61, 3850–3854. https://doi.org/10.1364/AO.456427 (2022).
doi: 10.1364/AO.456427
Josell, D., Braun, T. M. & Moffat, T. P. Mechanism of bismuth stimulated bottom-up gold feature filling. J. Electrochem. Soc. 169, 122507. https://doi.org/10.1149/1945-7111/acaccc (2022).
doi: 10.1149/1945-7111/acaccc
Tang, R. et al. Parameter space determination and auto-alignment in dual-phase interferometry. In preparation (2023).
Weitkamp, T. et al. X-ray phase imaging with a grating interferometer. Opt. Express 13, 6296. https://doi.org/10.1364/OPEX.13.006296 (2005).
doi: 10.1364/OPEX.13.006296
Dierick, M., Van Loo, D., Masschaele, B., Boone, M. & Van Hoorebeke, L. A LabVIEW® based generic CT scanner control software platform. J. X-ray Sci. Technol. 18, 451–461 (2010).
Spindler, S. et al. The choice of an autocorrelation length in dark-field lung imaging. Sci. Rep. 13, 2731 (2023).
doi: 10.1038/s41598-023-29762-y
Tang, R. et al. Pixel-wise beam-hardening correction for dark-field signal in X-ray dual-phase grating interferometry. Opt. Express 31, 40450–40468. https://doi.org/10.1364/OE.499397 (2023).
doi: 10.1364/OE.499397
Cheng, W. et al. Impact of heating on the nanostructure of red pine studied by small angle X-ray scattering. J. Anal. Appl. Pyrol. 108, 222–227. https://doi.org/10.1016/j.jaap.2014.04.013 (2014).
doi: 10.1016/j.jaap.2014.04.013
Cheng, W. et al. Small-angle X-ray scattering study on nanostructural changes with water content in red pine, American pine, and white ash. J. Wood Sci. 57, 470–478 (2011).
doi: 10.1007/s10086-011-1202-1