Effects of Dielectric Barrier on Water Activation and Phosphorus Compound Digestion in Gas-Liquid Discharges.

air–liquid discharge organic compound decomposition pin–liquid barrier discharge pin–liquid discharge plasma processing total dissolved phosphorus

Journal

Nanomaterials (Basel, Switzerland)
ISSN: 2079-4991
Titre abrégé: Nanomaterials (Basel)
Pays: Switzerland
ID NLM: 101610216

Informations de publication

Date de publication:
22 Dec 2023
Historique:
received: 14 11 2023
revised: 14 12 2023
accepted: 20 12 2023
medline: 11 1 2024
pubmed: 11 1 2024
entrez: 11 1 2024
Statut: epublish

Résumé

To generate a stable and effective air-liquid discharge in an open atmosphere, we investigated the effect of the dielectric barrier on the discharge between the pin electrode and liquid surface in an atmospheric-pressure plasma reactor. The atmospheric-pressure plasma reactor used in this study was based on a pin-plate discharge structure, and a metal wire was used as a pin-type power electrode. A plate-type ground electrode was placed above and below the vessel to compare the pin-liquid discharge and pin-liquid barrier discharge (PLBD). The results indicated that the PLBD configuration utilizing the bottom of the vessel as a dielectric barrier outperformed the pin-liquid setup in terms of the discharge stability and that the concentration of reactive species was different in the two plasma modes. PLBD can be used as a digestion technique for determining the phosphorus concentration in natural water sources. The method for decomposing phosphorus compounds by employing PLBD exhibited excellent decomposition performance, similar to the performance of thermochemical digestion-an established conventional method for phosphorus detection in water. The PLBD structure can replace the conventional chemical-agent-based digestion method for determining the total dissolved phosphorus concentration using the ascorbic acid reduction method.

Identifiants

pubmed: 38202495
pii: nano14010040
doi: 10.3390/nano14010040
pii:
doi:

Types de publication

Journal Article

Langues

eng

Subventions

Organisme : National Research Foundation of Korea
ID : 2020R1I1A3071693
Organisme : National Research Foundation of Korea
ID : 2021R1I1A3049028
Organisme : Ministry of Science and ICT
ID : 2018-0-00219

Auteurs

Ye Rin Lee (YR)

School of Electronic and Electrical Engineering, College of IT Engineering, Kyungpook National University, Daegu 41566, Republic of Korea.

Do Yeob Kim (DY)

Superintelligence Creative Research Laboratory, Electronics and Telecommunications Research Institute (ETRI), Daejeon 34129, Republic of Korea.

Jae Young Kim (JY)

School of Electronic and Electrical Engineering, College of IT Engineering, Kyungpook National University, Daegu 41566, Republic of Korea.

Da Hye Lee (DH)

School of Electronic and Electrical Engineering, College of IT Engineering, Kyungpook National University, Daegu 41566, Republic of Korea.

Gyu Tae Bae (GT)

School of Electronic and Electrical Engineering, College of IT Engineering, Kyungpook National University, Daegu 41566, Republic of Korea.

Hyojun Jang (H)

School of Electronic and Electrical Engineering, College of IT Engineering, Kyungpook National University, Daegu 41566, Republic of Korea.

Joo Young Park (JY)

Department of Nano-Bio Convergence, Korea Institute of Materials Science, Changwon 51508, Republic of Korea.

Sunghoon Jung (S)

Department of Nano-Bio Convergence, Korea Institute of Materials Science, Changwon 51508, Republic of Korea.

Eun Young Jung (EY)

School of Electronic and Electrical Engineering, College of IT Engineering, Kyungpook National University, Daegu 41566, Republic of Korea.
The Institute of Electronic Technology, College of IT Engineering, Kyungpook National University, Daegu 41566, Republic of Korea.

Choon-Sang Park (CS)

Department of Electrical Engineering, Milligan University, Johnson City, TN 37682, USA.

Hyung-Kun Lee (HK)

Superintelligence Creative Research Laboratory, Electronics and Telecommunications Research Institute (ETRI), Daejeon 34129, Republic of Korea.

Heung-Sik Tae (HS)

School of Electronic and Electrical Engineering, College of IT Engineering, Kyungpook National University, Daegu 41566, Republic of Korea.

Classifications MeSH