Comparison of Different Cooling Schemes for AlGaN/GaN High-Electron Mobility Transistors.
AlGaN/GaN HEMTs
chip-embedded cooling
hotspot
near-chip cooling
remote cooling
Journal
Micromachines
ISSN: 2072-666X
Titre abrégé: Micromachines (Basel)
Pays: Switzerland
ID NLM: 101640903
Informations de publication
Date de publication:
23 Dec 2023
23 Dec 2023
Historique:
received:
25
11
2023
revised:
19
12
2023
accepted:
21
12
2023
medline:
23
1
2024
pubmed:
23
1
2024
entrez:
23
1
2024
Statut:
epublish
Résumé
Cooling is important for AlGaN/GaN high-electron mobility transistors (HEMTs) performance. In this paper, the advantages and disadvantages of the cooling performance of three cooling schemes: remote cooling (R-cool), near-chip cooling (NC-cool), and chip-embedded cooling (CE-cool) are compared. The influences of distinct geometric parameters and operating conditions on thermal resistance are investigated. The results show that the thermal resistances of NC-cool and CE-cool are almost the same as each other. Decreasing microchannel base thickness (
Identifiants
pubmed: 38258152
pii: mi15010033
doi: 10.3390/mi15010033
pii:
doi:
Types de publication
Journal Article
Langues
eng
Subventions
Organisme : National Natural Science Foundation of China
ID : 62104249
Organisme : Youth Innovation Promotion Association
ID : 2023126