Live Iterative Ptychography.

X-ray microscopy live processing ptychography

Journal

Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada
ISSN: 1435-8115
Titre abrégé: Microsc Microanal
Pays: England
ID NLM: 9712707

Informations de publication

Date de publication:
20 Feb 2024
Historique:
received: 11 08 2023
revised: 15 12 2023
accepted: 09 01 2024
medline: 20 2 2024
pubmed: 20 2 2024
entrez: 20 2 2024
Statut: aheadofprint

Résumé

We demonstrate live-updating ptychographic reconstruction with the extended ptychographical iterative engine, an iterative ptychography method, during ongoing data acquisition. The reconstruction starts with a small subset of the total data, and as the acquisition proceeds the data used for reconstruction are extended. This creates a live-updating view of object and illumination that allows monitoring the ongoing experiment and adjusting parameters with quick turn around. This is particularly advantageous for long-running acquisitions. We show that such a gradual reconstruction yields interpretable results already with a small subset of the data. We show simulated live processing with various scan patterns, parallelized reconstruction, and real-world live processing at the hard X-ray ptychographic nanoanalytical microscope PtyNAMi at the PETRA III beamline.

Identifiants

pubmed: 38376755
pii: 7611447
doi: 10.1093/mam/ozae004
pii:
doi:

Types de publication

Journal Article

Langues

eng

Sous-ensembles de citation

IM

Informations de copyright

© The Author(s) 2024. Published by Oxford University Press on behalf of the Microscopy Society of America.

Déclaration de conflit d'intérêts

Conflict of Interest. The authors declare no competing interests.

Auteurs

Dieter Weber (D)

Ernst Ruska-Centre for Microscopy and Spectroscopy with Electrons, Forschungszentrum Jülich, Jülich 52425, Germany.

Simeon Ehrig (S)

Helmholtz-Zentrum Dresden-Rossendorf, Dresden D-01328, Germany.
Center for Advanced Systems Understanding, Untermarkt 20, Görlitz 02826, Germany.

Andreas Schropp (A)

Center for X-ray and Nano Science CXNS, Deutsches Elektronen-Synchrotron DESY, Notkestr. 85, Hamburg 22607, Germany.
Helmholtz Imaging, Deutsches Elektronen-Synchrotron DESY, Notkestr. 85, Hamburg 22607, Germany.

Alexander Clausen (A)

Ernst Ruska-Centre for Microscopy and Spectroscopy with Electrons, Forschungszentrum Jülich, Jülich 52425, Germany.

Silvio Achilles (S)

Center for X-ray and Nano Science CXNS, Deutsches Elektronen-Synchrotron DESY, Notkestr. 85, Hamburg 22607, Germany.

Nico Hoffmann (N)

Helmholtz-Zentrum Dresden-Rossendorf, Dresden D-01328, Germany.

Michael Bussmann (M)

Helmholtz-Zentrum Dresden-Rossendorf, Dresden D-01328, Germany.
Center for Advanced Systems Understanding, Untermarkt 20, Görlitz 02826, Germany.

Rafal E Dunin-Borkowski (RE)

Ernst Ruska-Centre for Microscopy and Spectroscopy with Electrons, Forschungszentrum Jülich, Jülich 52425, Germany.

Christian G Schroer (CG)

Center for X-ray and Nano Science CXNS, Deutsches Elektronen-Synchrotron DESY, Notkestr. 85, Hamburg 22607, Germany.
Department Physik, Universität Hamburg, Luruper Chaussee 149, 22761 Hamburg, Germany.

Classifications MeSH