Design, fabrication, and characterization of kinetic-inductive force sensors for scanning probe applications.
atomic force microscopy
force sensing
kinetic inductance
optomechanics
superconductivity
Journal
Beilstein journal of nanotechnology
ISSN: 2190-4286
Titre abrégé: Beilstein J Nanotechnol
Pays: Germany
ID NLM: 101551563
Informations de publication
Date de publication:
2024
2024
Historique:
received:
23
10
2023
accepted:
31
01
2024
medline:
21
2
2024
pubmed:
21
2
2024
entrez:
21
2
2024
Statut:
epublish
Résumé
We describe a transducer for low-temperature atomic force microscopy based on electromechanical coupling due to a strain-dependent kinetic inductance of a superconducting nanowire. The force sensor is a bending triangular plate (cantilever) whose deflection is measured via a shift in the resonant frequency of a high-
Identifiants
pubmed: 38379930
doi: 10.3762/bjnano.15.23
pmc: PMC10877079
doi:
Types de publication
Journal Article
Langues
eng
Pagination
242-255Informations de copyright
Copyright © 2024, Roos et al.
Déclaration de conflit d'intérêts
DBH is a part owner of Intermodulation Products AB, which manufactures and sells the microwave measurement platform used in this experiment. AKR, ES, EKA, and EH declare no competing interests.