Weak signal extraction enabled by deep neural network denoising of diffraction data.

Computational science Condensed-matter physics

Journal

Nature machine intelligence
ISSN: 2522-5839
Titre abrégé: Nat Mach Intell
Pays: England
ID NLM: 101740243

Informations de publication

Date de publication:
2024
Historique:
received: 26 08 2022
accepted: 08 01 2024
medline: 26 2 2024
pubmed: 26 2 2024
entrez: 26 2 2024
Statut: ppublish

Résumé

The removal or cancellation of noise has wide-spread applications in imaging and acoustics. In applications in everyday life, such as image restoration, denoising may even include generative aspects, which are unfaithful to the ground truth. For scientific use, however, denoising must reproduce the ground truth accurately. Denoising scientific data is further challenged by unknown noise profiles. In fact, such data will often include noise from multiple distinct sources, which substantially reduces the applicability of simulation-based approaches. Here we show how scientific data can be denoised by using a deep convolutional neural network such that weak signals appear with quantitative accuracy. In particular, we study X-ray diffraction and resonant X-ray scattering data recorded on crystalline materials. We demonstrate that weak signals stemming from charge ordering, insignificant in the noisy data, become visible and accurate in the denoised data. This success is enabled by supervised training of a deep neural network with pairs of measured low- and high-noise data. We additionally show that using artificial noise does not yield such quantitatively accurate results. Our approach thus illustrates a practical strategy for noise filtering that can be applied to challenging acquisition problems.

Identifiants

pubmed: 38404481
doi: 10.1038/s42256-024-00790-1
pii: 790
pmc: PMC10883886
doi:

Types de publication

Journal Article

Langues

eng

Pagination

180-186

Informations de copyright

© The Author(s) 2024.

Déclaration de conflit d'intérêts

Competing interestsThe authors declare no competing interests.

Auteurs

Jens Oppliger (J)

Physik-Institut, Universität Zürich, Zurich, Switzerland.

M Michael Denner (MM)

Physik-Institut, Universität Zürich, Zurich, Switzerland.

Julia Küspert (J)

Physik-Institut, Universität Zürich, Zurich, Switzerland.

Ruggero Frison (R)

Physik-Institut, Universität Zürich, Zurich, Switzerland.

Qisi Wang (Q)

Physik-Institut, Universität Zürich, Zurich, Switzerland.
Department of Physics, The Chinese University of Hong Kong, Hong Kong, China.

Alexander Morawietz (A)

Physik-Institut, Universität Zürich, Zurich, Switzerland.

Oleh Ivashko (O)

Deutsches Elektronen-Synchrotron DESY, Hamburg, Germany.

Ann-Christin Dippel (AC)

Deutsches Elektronen-Synchrotron DESY, Hamburg, Germany.

Martin von Zimmermann (MV)

Deutsches Elektronen-Synchrotron DESY, Hamburg, Germany.

Izabela Biało (I)

Physik-Institut, Universität Zürich, Zurich, Switzerland.
Faculty of Physics and Applied Computer Science, AGH University of Krakow, Krakow, Poland.

Leonardo Martinelli (L)

Physik-Institut, Universität Zürich, Zurich, Switzerland.

Benoît Fauqué (B)

JEIP, USR 3573 CNRS, Collège de France, PSL University, Paris, France.

Jaewon Choi (J)

Diamond Light Source, Didcot, UK.

Mirian Garcia-Fernandez (M)

Diamond Light Source, Didcot, UK.

Ke-Jin Zhou (KJ)

Diamond Light Source, Didcot, UK.

Niels Bech Christensen (NB)

Department of Physics, Technical University of Denmark, Kongens Lyngby, Denmark.

Tohru Kurosawa (T)

Department of Physics, Hokkaido University, Sapporo, Japan.

Naoki Momono (N)

Department of Physics, Hokkaido University, Sapporo, Japan.
Department of Applied Sciences, Muroran Institute of Technology, Muroran, Japan.

Migaku Oda (M)

Department of Physics, Hokkaido University, Sapporo, Japan.

Fabian D Natterer (FD)

Physik-Institut, Universität Zürich, Zurich, Switzerland.

Mark H Fischer (MH)

Physik-Institut, Universität Zürich, Zurich, Switzerland.

Titus Neupert (T)

Physik-Institut, Universität Zürich, Zurich, Switzerland.

Johan Chang (J)

Physik-Institut, Universität Zürich, Zurich, Switzerland.

Classifications MeSH