A Study of High-Frequency Noise for Microplastics Classification Using Raman Spectroscopy and Machine Learning.

Raman spectroscopy high-frequency noise microplastics principal component analysis signal pre-processing supervised classification

Journal

Applied spectroscopy
ISSN: 1943-3530
Titre abrégé: Appl Spectrosc
Pays: United States
ID NLM: 0372406

Informations de publication

Date de publication:
11 Mar 2024
Historique:
medline: 11 3 2024
pubmed: 11 3 2024
entrez: 11 3 2024
Statut: aheadofprint

Résumé

Given the growing urge for plastic management and regulation in the world, recent studies have investigated the problem of plastic material identification for correct classification and disposal. Recent works have shown the potential of machine learning techniques for successful microplastics classification using Raman signals. Classification techniques from the machine learning area allow the identification of the type of microplastic from optical signals based on Raman spectroscopy. In this paper, we investigate the impact of high-frequency noise on the performance of related classification tasks. It is well-known that classification based on Raman is highly dependent on peak visibility, but it is also known that signal smoothing is a common step in the pre-processing of the measured signals. This raises a potential trade-off between high-frequency noise and peak preservation that depends on user-defined parameters. The results obtained in this work suggest that a linear discriminant analysis model cannot generalize properly in the presence of noisy signals, whereas an error-correcting output codes model is better suited to account for inherent noise. Moreover, principal components analysis (PCA) can become a must-do step for robust classification models, given its simplicity and natural smoothing capabilities. Our study on the high-frequency noise, the possible trade-off between pre-processing the high-frequency noise and the peak visibility, and the use of PCA as a noise reduction technique in addition to its dimensionality reduction functionality are the fundamental aspects of this work.

Identifiants

pubmed: 38465603
doi: 10.1177/00037028241233304
doi:

Types de publication

Journal Article

Langues

eng

Sous-ensembles de citation

IM

Pagination

37028241233304

Déclaration de conflit d'intérêts

Declaration of Conflicting InterestsThe authors declared no potential conflicts of interest with respect to the research, authorship, and/or publication of this article.

Auteurs

David Plazas (D)

School of Applied Sciences and Engineering, Universidad EAFIT, Medellín, Colombia.
Brussels Photonics, Department of Applied Physics and Photonics, Vrije Universiteit Brussel, Brussels, Belgium.

Francesco Ferranti (F)

Brussels Photonics, Department of Applied Physics and Photonics, Vrije Universiteit Brussel and Flanders Make, Brussels, Belgium.

Qing Liu (Q)

Brussels Photonics, Department of Applied Physics and Photonics, Vrije Universiteit Brussel and Flanders Make, Brussels, Belgium.

Mehrdad Lotfi Choobbari (M)

Brussels Photonics, Department of Applied Physics and Photonics, Vrije Universiteit Brussel, Brussels, Belgium.

Heidi Ottevaere (H)

Brussels Photonics, Department of Applied Physics and Photonics, Vrije Universiteit Brussel and Flanders Make, Brussels, Belgium.

Classifications MeSH