Designing next-generation subscalp devices for seizure monitoring: A systematic review and meta-analysis of established extracranial hardware.

Electroencephalography Epilepsy monitoring Neuro-engineering Neurostimulation Subscalp devices

Journal

Epilepsy research
ISSN: 1872-6844
Titre abrégé: Epilepsy Res
Pays: Netherlands
ID NLM: 8703089

Informations de publication

Date de publication:
30 Mar 2024
Historique:
received: 06 01 2024
revised: 07 03 2024
accepted: 28 03 2024
medline: 3 4 2024
pubmed: 3 4 2024
entrez: 2 4 2024
Statut: aheadofprint

Résumé

Implantable brain recording and stimulation devices apply to a broad spectrum of conditions, such as epilepsy, movement disorders and depression. For long-term monitoring and neuromodulation in epilepsy patients, future extracranial subscalp implants may offer a promising, less-invasive alternative to intracranial neurotechnologies. To inform the design and assess the safety profile of such next-generation devices, we estimated extracranial complication rates of deep brain stimulation (DBS), cranial peripheral nerve stimulation (PNS), responsive neurostimulation (RNS) and existing subscalp EEG devices (sqEEG), as proxy for future implants. Pubmed was searched systematically for DBS, PNS, RNS and sqEEG studies from 2000 to February 2024 (48 publications, 7329 patients). We identified seven categories of extracranial adverse events: infection, non-infectious cutaneous complications, lead migration, lead fracture, hardware malfunction, pain and hemato-seroma. We used cohort sizes, demographics and industry funding as metrics to assess risks of bias. An inverse variance heterogeneity model was used for pooled and subgroup meta-analysis. The pooled incidence of extracranial complications reached 14.0%, with infections (4.6%, CI 95% [3.2 - 6.2]), surgical site pain (3.2%, [0.6 - 6.4]) and lead migration (2.6%, [1.0 - 4.4]) as leading causes. Subgroup analysis showed a particularly high incidence of persisting pain following PNS (12.0%, [6.8 - 17.9]) and sqEEG (23.9%, [12.7 - 37.2]) implantation. High rates of lead migration (12.4%, [6.4 - 19.3]) were also identified in the PNS subgroup. Complication analysis of DBS, PNS, RNS and sqEEG studies provides a significant opportunity to optimize the safety profile of future implantable subscalp devices for chronic EEG monitoring. Developing such promising technologies must address the risks of infection, surgical site pain, lead migration and skin erosion. A thin and robust design, coupled to a lead-anchoring system, shall enhance the durability and utility of next-generation subscalp implants for long-term EEG monitoring and neuromodulation.

Identifiants

pubmed: 38564925
pii: S0920-1211(24)00071-8
doi: 10.1016/j.eplepsyres.2024.107356
pii:
doi:

Types de publication

Journal Article Review

Langues

eng

Sous-ensembles de citation

IM

Pagination

107356

Informations de copyright

Copyright © 2024 The Authors. Published by Elsevier B.V. All rights reserved.

Déclaration de conflit d'intérêts

Declaration of Competing Interest M.O.B. and G.K. hold shares with Epios, Ltd., a medical device company based in Geneva, Switzerland that develops a sub-scalp EEG system; C.P. is co-founder of Aleva Neurotherapeutics, a medical device company based in Lausanne Switzerland, currently without any active role in the company. The other authors report no conflict of interest. We confirm that we have read the Journal’s position on issues involved in ethical publication and affirm that this report is consistent with those guidelines.

Auteurs

Sabry L Barlatey (SL)

Department of Neurosurgery, Inselspital Bern, University Hospital, University of Bern, Bern, Switzerland. Electronic address: sabry.barlatey@insel.ch.

George Kouvas (G)

Wyss Center for Bio- and Neuro-engineering, Geneva, Switzerland.

Aleksander Sobolewski (A)

Wyss Center for Bio- and Neuro-engineering, Geneva, Switzerland.

Andreas Nowacki (A)

Department of Neurosurgery, Inselspital Bern, University Hospital, University of Bern, Bern, Switzerland.

Claudio Pollo (C)

Department of Neurosurgery, Inselspital Bern, University Hospital, University of Bern, Bern, Switzerland.

Maxime O Baud (MO)

Wyss Center for Bio- and Neuro-engineering, Geneva, Switzerland; Sleep-wake-epilepsy Center, NeuroTec, Center for Experimental Neurology, Department of Neurology, Inselspital Bern, University Hospital, University of Bern, Bern, Switzerland.

Classifications MeSH