Infrared Imaging Using Thermally Stable HgTe/CdS Nanocrystals.

HgTe core−shell imaging infrared nanocrystals thermal stability

Journal

Nano letters
ISSN: 1530-6992
Titre abrégé: Nano Lett
Pays: United States
ID NLM: 101088070

Informations de publication

Date de publication:
12 Apr 2024
Historique:
medline: 12 4 2024
pubmed: 12 4 2024
entrez: 12 4 2024
Statut: aheadofprint

Résumé

Transferring nanocrystals (NCs) from the laboratory environment toward practical applications has raised new challenges. HgTe appears as the most spectrally tunable infrared colloidal platform. Its low-temperature synthesis reduces the growth energy cost yet also favors sintering. Once coupled to a read-out circuit, the Joule effect aggregates the particles, leading to a poorly defined optical edge and large dark current. Here, we demonstrate that CdS shells bring the expected thermal stability (no redshift upon annealing, reduced tendency to form amalgams, and preservation of photoconduction after an atomic layer deposition process). The electronic structure of these confined particles is unveiled using k.p self-consistent simulations showing a significant exciton binding energy of ∼200 meV. After shelling, the material displays a p

Identifiants

pubmed: 38608158
doi: 10.1021/acs.nanolett.4c00907
doi:

Types de publication

Journal Article

Langues

eng

Sous-ensembles de citation

IM

Auteurs

Huichen Zhang (H)

Sorbonne Université, CNRS, Institut des NanoSciences de Paris, Paris 75005, France.

Yoann Prado (Y)

Sorbonne Université, CNRS, Institut des NanoSciences de Paris, Paris 75005, France.

Rodolphe Alchaar (R)

Sorbonne Université, CNRS, Institut des NanoSciences de Paris, Paris 75005, France.

Henri Lehouelleur (H)

Laboratoire de Physique et d'Etude des Matériaux, ESPCI-Paris, PSL Research University, Sorbonne Université, CNRS, Paris 75005, France.

Mariarosa Cavallo (M)

Sorbonne Université, CNRS, Institut des NanoSciences de Paris, Paris 75005, France.

Tung Huu Dang (TH)

Sorbonne Université, CNRS, Institut des NanoSciences de Paris, Paris 75005, France.
Laboratoire de Physique de l'Ecole normale supérieure, ENS, Université PSL, CNRS, Sorbonne Université, Sorbonne Paris Cité, Paris 75005, France.

Adrien Khalili (A)

Sorbonne Université, CNRS, Institut des NanoSciences de Paris, Paris 75005, France.

Erwan Bossavit (E)

Sorbonne Université, CNRS, Institut des NanoSciences de Paris, Paris 75005, France.
Synchrotron SOLEIL, Saint-Aubin 91190, France.

Corentin Dabard (C)

Laboratoire de Physique et d'Etude des Matériaux, ESPCI-Paris, PSL Research University, Sorbonne Université, CNRS, Paris 75005, France.

Nicolas Ledos (N)

Sorbonne Université, CNRS, Institut des NanoSciences de Paris, Paris 75005, France.

Mathieu G Silly (MG)

Synchrotron SOLEIL, Saint-Aubin 91190, France.

Ali Madouri (A)

Centre de Nanosciences et de Nanotechnologies, CNRS, Université Paris-Saclay, C2N, Palaiseau 91120, France.

Daniele Fournier (D)

Sorbonne Université, CNRS, Institut des NanoSciences de Paris, Paris 75005, France.

James K Utterback (JK)

Sorbonne Université, CNRS, Institut des NanoSciences de Paris, Paris 75005, France.

Debora Pierucci (D)

Sorbonne Université, CNRS, Institut des NanoSciences de Paris, Paris 75005, France.

Victor Parahyba (V)

New Imaging Technologies SA, Verrières le Buisson 91370, France.

Pierre Potet (P)

New Imaging Technologies SA, Verrières le Buisson 91370, France.

David Darson (D)

Laboratoire de Physique de l'Ecole normale supérieure, ENS, Université PSL, CNRS, Sorbonne Université, Sorbonne Paris Cité, Paris 75005, France.

Sandrine Ithurria (S)

Laboratoire de Physique et d'Etude des Matériaux, ESPCI-Paris, PSL Research University, Sorbonne Université, CNRS, Paris 75005, France.
Faculty of Physics and Applied Computer Science, AGH University, Kraków PL-30-059, Poland.

Benjamin T Diroll (BT)

Center for Nanoscale Materials, Argonne National Laboratory, Lemont, Illinois 60439, United States.

Juan I Climente (JI)

Departament de Quimica Fisica i Analitica, Universitat Jaume I, Castello de la Plana E-12080, Spain.

Emmanuel Lhuillier (E)

Sorbonne Université, CNRS, Institut des NanoSciences de Paris, Paris 75005, France.

Classifications MeSH