Electro-optic tuning in composite silicon photonics based on ferroionic 2D materials.


Journal

Light, science & applications
ISSN: 2047-7538
Titre abrégé: Light Sci Appl
Pays: England
ID NLM: 101610753

Informations de publication

Date de publication:
19 Apr 2024
Historique:
received: 14 10 2023
accepted: 18 03 2024
revised: 15 03 2024
medline: 20 4 2024
pubmed: 20 4 2024
entrez: 19 4 2024
Statut: epublish

Résumé

Tunable optical materials are indispensable elements in modern optoelectronics, especially in integrated photonics circuits where precise control over the effective refractive index is essential for diverse applications. Two-dimensional materials like transition metal dichalcogenides (TMDs) and graphene exhibit remarkable optical responses to external stimuli. However, achieving distinctive modulation across short-wave infrared (SWIR) regions while enabling precise phase control at low signal loss within a compact footprint remains an ongoing challenge. In this work, we unveil the robust electro-refractive response of multilayer ferroionic two-dimensional CuCrP

Identifiants

pubmed: 38641636
doi: 10.1038/s41377-024-01432-2
pii: 10.1038/s41377-024-01432-2
doi:

Types de publication

Journal Article

Langues

eng

Pagination

92

Informations de copyright

© 2024. The Author(s).

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Auteurs

Ghada Dushaq (G)

Department of Electrical and Computer Engineering, New York University Abu Dhabi, P.O. Box 129188, Abu Dhabi, United Arab Emirates. ghd1@nyu.edu.

Solomon Serunjogi (S)

Department of Electrical and Computer Engineering, New York University Abu Dhabi, P.O. Box 129188, Abu Dhabi, United Arab Emirates.

Srinivasa R Tamalampudi (SR)

Department of Electrical and Computer Engineering, New York University Abu Dhabi, P.O. Box 129188, Abu Dhabi, United Arab Emirates.

Mahmoud Rasras (M)

Department of Electrical and Computer Engineering, New York University Abu Dhabi, P.O. Box 129188, Abu Dhabi, United Arab Emirates. mr5098@nyu.edu.
NYU Tandon School of Engineering, New York University, New York, NY, USA. mr5098@nyu.edu.

Classifications MeSH