Structure-Related Electronic and Magnetic Properties in Ultrathin Epitaxial Ni

SQUID X-ray absorption spectroscopy X-ray circular dichroism X-ray diffraction disordererd phase hard X-ray photoelectron spectroscopy nickel ferrite strain-property relation synchrotron radiation ultrathin films

Journal

Nanomaterials (Basel, Switzerland)
ISSN: 2079-4991
Titre abrégé: Nanomaterials (Basel)
Pays: Switzerland
ID NLM: 101610216

Informations de publication

Date de publication:
17 Apr 2024
Historique:
received: 14 03 2024
revised: 11 04 2024
accepted: 13 04 2024
medline: 26 4 2024
pubmed: 26 4 2024
entrez: 26 4 2024
Statut: epublish

Résumé

Off-stoichiometric Ni

Identifiants

pubmed: 38668188
pii: nano14080694
doi: 10.3390/nano14080694
pii:
doi:

Types de publication

Journal Article

Langues

eng

Auteurs

Jari Rodewald (J)

Department of Physics, Osnabrück University, 49076 Osnabrück, Germany.

Jannis Thien (J)

Department of Physics, Osnabrück University, 49076 Osnabrück, Germany.

Kevin Ruwisch (K)

Department of Physics, Osnabrück University, 49076 Osnabrück, Germany.

Tobias Pohlmann (T)

Department of Physics, Osnabrück University, 49076 Osnabrück, Germany.
Deutsches Elektronen-Synchrotron (DESY), Photon Science, 22607 Hamburg, Germany.

Martin Hoppe (M)

Department of Physics, Osnabrück University, 49076 Osnabrück, Germany.
Deutsches Elektronen-Synchrotron (DESY), Photon Science, 22607 Hamburg, Germany.

Jan Schmalhorst (J)

Center for Spinelectronic Materials and Devices, Department of Physics, Bielefeld University, Universitätsstraße 25, 33615 Bielefeld, Germany.

Karsten Küpper (K)

Department of Physics, Osnabrück University, 49076 Osnabrück, Germany.

Joachim Wollschläger (J)

Department of Physics, Osnabrück University, 49076 Osnabrück, Germany.

Classifications MeSH