Surface-Enhanced Raman Spectroscopy and Artificial Neural Networks for Detection of MXene Flakes' Surface Terminations.


Journal

The journal of physical chemistry. C, Nanomaterials and interfaces
ISSN: 1932-7447
Titre abrégé: J Phys Chem C Nanomater Interfaces
Pays: United States
ID NLM: 101299949

Informations de publication

Date de publication:
25 Apr 2024
Historique:
received: 27 02 2024
revised: 25 03 2024
accepted: 27 03 2024
medline: 1 5 2024
pubmed: 1 5 2024
entrez: 1 5 2024
Statut: epublish

Résumé

The properties of MXene flakes, a new class of two-dimensional materials, are strictly determined by their surface termination. The most common termination groups are oxygen-containing (=O or -OH) and fluorine (-F), and their relative ratio is closely related to flake stability and catalytic activity. The surface termination can vary significantly among MXene flakes depending on the preparation route and is commonly determined after flake preparation by using X-ray photoelectron spectroscopy (XPS). In this paper, as an alternative approach, we propose the combination of surface-enhanced Raman spectroscopy (SERS) and artificial neural networks (ANN) for the precise and reliable determination of MXene flakes' (Ti

Identifiants

pubmed: 38690535
doi: 10.1021/acs.jpcc.4c01273
pmc: PMC11056973
doi:

Types de publication

Journal Article

Langues

eng

Pagination

6780-6787

Informations de copyright

© 2024 The Authors. Published by American Chemical Society.

Déclaration de conflit d'intérêts

The authors declare no competing financial interest.

Auteurs

Andrii Trelin (A)

Department of Solid State Engineering, University of Chemistry and Technology, Prague 16628, Czech Republic.

Anastasiia Skvortsova (A)

Department of Solid State Engineering, University of Chemistry and Technology, Prague 16628, Czech Republic.

Anastasia Olshtrem (A)

Department of Solid State Engineering, University of Chemistry and Technology, Prague 16628, Czech Republic.

Sergii Chertopalov (S)

Institute of Physics of the Czech Academy of Sciences, Prague 18220, Czech Republic.

David Mares (D)

Department of Microelectronics, Faculty of Electrical Engineering, Czech Technical University, Prague 16627, Czech Republic.

Ladislav Lapcak (L)

Central Laboratories, University of Chemistry and Technology, Prague 16628, Czech Republic.

Martin Vondracek (M)

Institute of Physics of the Czech Academy of Sciences, Prague 18220, Czech Republic.

Petr Sajdl (P)

Department of Power Engineering, University of Chemistry and Technology, Prague 16628, Czech Republic.

Vitezslav Jerabek (V)

Department of Microelectronics, Faculty of Electrical Engineering, Czech Technical University, Prague 16627, Czech Republic.

Jaroslav Maixner (J)

Central Laboratories, University of Chemistry and Technology, Prague 16628, Czech Republic.

Jan Lancok (J)

Institute of Physics of the Czech Academy of Sciences, Prague 18220, Czech Republic.

Zdenek Sofer (Z)

Department of Inorganic Chemistry, University of Chemistry and Technology, Prague 16628, Czech Republic.

Jakub Regner (J)

Department of Inorganic Chemistry, University of Chemistry and Technology, Prague 16628, Czech Republic.

Zdenka Kolska (Z)

Centre for Nanomaterials and Biotechnology, J. E. Purkyne University, Usti nad Labem 40096, Czech Republic.

Vaclav Svorcik (V)

Department of Solid State Engineering, University of Chemistry and Technology, Prague 16628, Czech Republic.

Oleksiy Lyutakov (O)

Department of Solid State Engineering, University of Chemistry and Technology, Prague 16628, Czech Republic.

Classifications MeSH