5G-enabled, battery-less smart skins for self-monitoring megastructures and digital twin applications.


Journal

Scientific reports
ISSN: 2045-2322
Titre abrégé: Sci Rep
Pays: England
ID NLM: 101563288

Informations de publication

Date de publication:
01 May 2024
Historique:
received: 22 11 2023
accepted: 27 03 2024
medline: 2 5 2024
pubmed: 2 5 2024
entrez: 1 5 2024
Statut: epublish

Résumé

With the current development of the 5G infrastructure, there presents a unique opportunity for the deployment of battery-less mmWave reflect-array-based sensors. These fully-passive devices benefit from having a larger detectability than alternative battery-less solutions to create self-monitoring megastructures. The presented 'smart' skin sensor uses a Van-Atta array design enabling ubiquitous local strain monitoring for the structural health monitoring of composite materials featuring wide interrogation angles. Proof-of-concept prototypes of these 'smart' skin millimeter-wave identification tags, that can be mounted on or embedded within common materials used in wind turbine blades, present a highly-detectable radar cross-section of - 33.75 dBsm and - 35.00 dBsm for mounted and embedded sensors respectively. Both sensors display a minimum resolution of 202

Identifiants

pubmed: 38693170
doi: 10.1038/s41598-024-58257-7
pii: 10.1038/s41598-024-58257-7
doi:

Types de publication

Journal Article

Langues

eng

Sous-ensembles de citation

IM

Pagination

10002

Subventions

Organisme : NextFlex
ID : FA8650-15-2-5401

Informations de copyright

© 2024. The Author(s).

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Auteurs

Charles Lynch (C)

Georgia Institute of Technology, School of ECE, Atlanta, GA, 30308, USA. clynch19@gatech.edu.

Ajibayo Adeyeye (A)

Georgia Institute of Technology, School of ECE, Atlanta, GA, 30308, USA.

El Mehdi Abbara (EM)

Binghamton University, Binghamton, NY, 13902, USA.

Ashraf Umar (A)

Binghamton University, Binghamton, NY, 13902, USA.

Mohammed Alhendi (M)

Binghamton University, Binghamton, NY, 13902, USA.

Chris Minnella (C)

Sikorsky, a Lockheed Martin Company, Rochester, NY, 14623, USA.

Joseph Iannotti (J)

GE Global Research, Niskayuna, NY, 12309, USA.

Nancy Stoffel (N)

GE Global Research, Niskayuna, NY, 12309, USA.

Mark Poliks (M)

Binghamton University, Binghamton, NY, 13902, USA.

Manos M Tentzeris (MM)

Georgia Institute of Technology, School of ECE, Atlanta, GA, 30308, USA.

Classifications MeSH