Controlled Anisotropic Wetting by Plasma Treatment for Directed Self-Assembly of High-χ Block Copolymers.

anisotropic wetting block copolymer lithography directed self-assembly graphoepitaxy nanopatterning plasma etching

Journal

ACS applied materials & interfaces
ISSN: 1944-8252
Titre abrégé: ACS Appl Mater Interfaces
Pays: United States
ID NLM: 101504991

Informations de publication

Date de publication:
17 May 2024
Historique:
medline: 17 5 2024
pubmed: 17 5 2024
entrez: 17 5 2024
Statut: aheadofprint

Résumé

The directed self-assembly (DSA) of block copolymers (BCPs) is a promising next-generation lithography technique for high-resolution patterning. However, achieving lithographically applicable BCP organization such as out-of-plane lamellae requires proper tuning of interfacial energies between the BCP domains and the substrate, which remains difficult to address effectively and efficiently with high-χ BCPs. Here, we present the successful generation of anisotropic wetting by plasma treatment on patterned spin-on-carbon (SOC) substrates and its application to the DSA of a high-χ Si-containing material, poly(1,1-dimethylsilacyclobutane)-

Identifiants

pubmed: 38758246
doi: 10.1021/acsami.4c01657
doi:

Types de publication

Journal Article

Langues

eng

Sous-ensembles de citation

IM

Auteurs

Achmad Fajar Putranto (AF)

CNRS, CEA/LETI Minatec, Laboratoire des Technologies de la Microélectronique (LTM), Université Grenoble Alpes, 38000 Grenoble, France.

Camille Petit-Etienne (C)

CNRS, CEA/LETI Minatec, Laboratoire des Technologies de la Microélectronique (LTM), Université Grenoble Alpes, 38000 Grenoble, France.

Sébastien Cavalaglio (S)

CNRS, CEA/LETI Minatec, Laboratoire des Technologies de la Microélectronique (LTM), Université Grenoble Alpes, 38000 Grenoble, France.

Benjamin Cabannes-Boué (B)

CNRS, Bordeaux INP, LCPO, UMR 5629, Univ. Bordeaux, F-33600 Pessac, France.

Marie Panabiere (M)

CNRS, CEA/LETI Minatec, Laboratoire des Technologies de la Microélectronique (LTM), Université Grenoble Alpes, 38000 Grenoble, France.

Gianluca Forcina (G)

CNRS, CEA/LETI Minatec, Laboratoire des Technologies de la Microélectronique (LTM), Université Grenoble Alpes, 38000 Grenoble, France.

Guillaume Fleury (G)

CNRS, Bordeaux INP, LCPO, UMR 5629, Univ. Bordeaux, F-33600 Pessac, France.

Martin Kogelschatz (M)

CNRS, CEA/LETI Minatec, Laboratoire des Technologies de la Microélectronique (LTM), Université Grenoble Alpes, 38000 Grenoble, France.

Marc Zelsmann (M)

CNRS, CEA/LETI Minatec, Laboratoire des Technologies de la Microélectronique (LTM), Université Grenoble Alpes, 38000 Grenoble, France.

Classifications MeSH