Uniform large-area surface patterning achieved by metal dewetting for the top-down fabrication of GaN nanowire ensembles.

compound semiconductor nano-patterning nanostructure self-assembly

Journal

Nanotechnology
ISSN: 1361-6528
Titre abrégé: Nanotechnology
Pays: England
ID NLM: 101241272

Informations de publication

Date de publication:
11 Jun 2024
Historique:
medline: 12 6 2024
pubmed: 12 6 2024
entrez: 11 6 2024
Statut: aheadofprint

Résumé

The dewetting of thin Pt films on different surfaces is investigated as a means to provide the patterning for the top-down fabrication of GaN nanowire ensembles. The transformation from a thin film to an ensemble of nanoislands upon annealing proceeds in good agreement with the void growth model. With increasing annealing duration, the size and shape uniformity of the nanoislands improves. This improvement speeds up for higher annealing temperature. After an optimum annealing duration, the size uniformity deteriorates due to the coalescence of neighboring islands. By changing the Pt film thickness, the nanoisland diameter and density can be quantitatively controlled in a way predicted by a simple thermodynamic model. We demonstrate the uniformity of the nanoisland ensembles for an area larger than 1 cm². GaN nanowires are fabricated by a sequence of dry and wet etching steps, and these nanowires inherit the diameters and density of the Pt nanoisland ensemble used as a mask. Our study achieves advancements in size uniformity and range of obtainable diameters compared to previous works. This simple, economical, and scalable approach to the top-down fabrication of nanowires is useful for applications requiring large and uniform nanowire ensembles with controllable dimensions.

Identifiants

pubmed: 38861940
doi: 10.1088/1361-6528/ad5682
doi:

Types de publication

Journal Article

Langues

eng

Sous-ensembles de citation

IM

Informations de copyright

Creative Commons Attribution license.

Auteurs

Jingxuan Kang (J)

Epitaxy, Paul-Drude-Institut fur Festkorperelektronik Leibniz-Institut im Forschungsverbund Berlin eV, Hausvogteiplatz 5-7, Berlin, Berlin, 11017, GERMANY.

Rose-Mary Jose (RM)

Paul-Drude-Institut fur Festkorperelektronik Leibniz-Institut im Forschungsverbund Berlin eV, Hausvogteiplatz 5-7, Berlin, Berlin, Berlin, 11017, GERMANY.

Miriam Oliva (M)

Paul-Drude-Institut für Festkörperelektronik Leibniz-Institut im Forschungsverbund Berlin eV, Hausvogteiplatz 5-7, Berlin, 11017, GERMANY.

Thomas Auzelle (T)

Epitaxy, Paul-Drude-Institut fur Festkorperelektronik, Hausvogteiplatz 5-7, Berlin, 11017, GERMANY.

Mikel Gómez Ruiz (MG)

Paul Drude Institute for Solid State Electronics, Hausvogteiplatz 5-7, Berlin, 10117, GERMANY.

Abbes Tahraoui (A)

Paul-Drude-Institut für Festkörperelektronik Leibniz-Institut im Forschungsverbund Berlin eV, Hausvogteiplatz 5-7, Berlin, Berlin, 11017, GERMANY.

Jonas Lähnemann (J)

Semiconductor Spectroscopy, Paul-Drude-Institut für Festkörperelektronik Leibniz-Institut im Forschungsverbund Berlin eV, Hausvogteiplatz 5-7, Berlin, 10117, GERMANY.

Oliver Brandt (O)

Semiconductor Spectroscopy, Paul-Drude-Institut für Festkörperelektronik Leibniz-Institut im Forschungsverbund Berlin eV, Hausvogteiplatz 5-7, 10117 Berlin, Berlin, 10117, GERMANY.

Lutz Geelhaar (L)

Paul-Drude-Institut fuer Festkoerperelektronik, Hausvogteiplatz 5-7, Berlin, 10117, GERMANY.

Classifications MeSH