Elastic modulus of β-Ga
atomic force microscopy
elastic modulus
gallium oxide
mechanical properties
nanowire
scanning electron microscopy
Journal
Beilstein journal of nanotechnology
ISSN: 2190-4286
Titre abrégé: Beilstein J Nanotechnol
Pays: Germany
ID NLM: 101551563
Informations de publication
Date de publication:
2024
2024
Historique:
received:
26
02
2024
accepted:
23
05
2024
medline:
26
6
2024
pubmed:
26
6
2024
entrez:
26
6
2024
Statut:
epublish
Résumé
Due to the recent interest in ultrawide bandgap β-Ga
Identifiants
pubmed: 38919166
doi: 10.3762/bjnano.15.58
pmc: PMC11196948
doi:
Types de publication
Journal Article
Langues
eng
Pagination
704-712Informations de copyright
Copyright © 2024, Trausa et al.