Influence of loss function and electron dose on ptychography of 2D materials using the Wirtinger flow.
4D-STEM
Low-dose TEM
Phase retrieval
Transmission electron microscopy
Journal
Micron (Oxford, England : 1993)
ISSN: 1878-4291
Titre abrégé: Micron
Pays: England
ID NLM: 9312850
Informations de publication
Date de publication:
08 Jul 2024
08 Jul 2024
Historique:
received:
12
04
2024
revised:
21
06
2024
accepted:
01
07
2024
medline:
12
7
2024
pubmed:
12
7
2024
entrez:
11
7
2024
Statut:
aheadofprint
Résumé
Iterative phase retrieval is based on minimising a loss function as a measure of the consistency of an initial guess and underlying experimental data. Under ideal experimental conditions, real data contains Poissonian noise due to counting statistics. In this work, we use the Wirtinger Flow concept in combination with four common loss functions, being the L
Identifiants
pubmed: 38991624
pii: S0968-4328(24)00105-7
doi: 10.1016/j.micron.2024.103688
pii:
doi:
Types de publication
Journal Article
Langues
eng
Sous-ensembles de citation
IM
Pagination
103688Informations de copyright
Copyright © 2024 The Authors. Published by Elsevier Ltd.. All rights reserved.
Déclaration de conflit d'intérêts
Declaration of Competing Interest The authors declare no competing financial interests.