Analysis of Local Properties and Performance of Bilayer Epitaxial Graphene Field Effect Transistors on SiC.
DC and RF characterizations
Raman spectra analysis
bilayer graphene
field effect transistors
nanofabrication
silicon carbide
Journal
Materials (Basel, Switzerland)
ISSN: 1996-1944
Titre abrégé: Materials (Basel)
Pays: Switzerland
ID NLM: 101555929
Informations de publication
Date de publication:
18 Jul 2024
18 Jul 2024
Historique:
received:
05
06
2024
revised:
08
07
2024
accepted:
11
07
2024
medline:
27
7
2024
pubmed:
27
7
2024
entrez:
27
7
2024
Statut:
epublish
Résumé
Epitaxial bilayer graphene, grown by chemical vapor deposition on SiC substrates without silicon sublimation, is crucial material for graphene field effect transistors (GFETs). Rigorous characterization methods, such as atomic force microscopy and Raman spectroscopy, confirm the exceptional quality of this graphene. Post-nanofabrication, extensive evaluation of DC and high-frequency properties enable the extraction of critical parameters such as the current gain (
Identifiants
pubmed: 39063845
pii: ma17143553
doi: 10.3390/ma17143553
pii:
doi:
Types de publication
Journal Article
Langues
eng