Analysis of Local Properties and Performance of Bilayer Epitaxial Graphene Field Effect Transistors on SiC.

DC and RF characterizations Raman spectra analysis bilayer graphene field effect transistors nanofabrication silicon carbide

Journal

Materials (Basel, Switzerland)
ISSN: 1996-1944
Titre abrégé: Materials (Basel)
Pays: Switzerland
ID NLM: 101555929

Informations de publication

Date de publication:
18 Jul 2024
Historique:
received: 05 06 2024
revised: 08 07 2024
accepted: 11 07 2024
medline: 27 7 2024
pubmed: 27 7 2024
entrez: 27 7 2024
Statut: epublish

Résumé

Epitaxial bilayer graphene, grown by chemical vapor deposition on SiC substrates without silicon sublimation, is crucial material for graphene field effect transistors (GFETs). Rigorous characterization methods, such as atomic force microscopy and Raman spectroscopy, confirm the exceptional quality of this graphene. Post-nanofabrication, extensive evaluation of DC and high-frequency properties enable the extraction of critical parameters such as the current gain (

Identifiants

pubmed: 39063845
pii: ma17143553
doi: 10.3390/ma17143553
pii:
doi:

Types de publication

Journal Article

Langues

eng

Auteurs

Dalal Fadil (D)

University of Lille-IEMN CNRS UMR 8520, Avenue Poincaré, CS 60069, 59652 Villeneuve d'Ascq, France.
Departament d'Enginyeria Electrònica, Universitat Rovira I Virgili, 43007 Tarragona, Spain.

Wlodek Strupinski (W)

Faculty of Physics, Warsaw University of Technology, Koszykowa 75 Str., 00-662 Warsaw, Poland.

Emiliano Pallecchi (E)

University of Lille-IEMN CNRS UMR 8520, Avenue Poincaré, CS 60069, 59652 Villeneuve d'Ascq, France.

Henri Happy (H)

University of Lille-IEMN CNRS UMR 8520, Avenue Poincaré, CS 60069, 59652 Villeneuve d'Ascq, France.

Classifications MeSH