Electrosynthesis-Induced Pt Skin Effect in Mesoporous Ni-Rich Ni-Pt Thin Films for Hydrogen Evolution Reaction.

Pt skin effect electrodeposition hydrogen ion beam analysis mesoporous materials thin films water splitting

Journal

ACS applied materials & interfaces
ISSN: 1944-8252
Titre abrégé: ACS Appl Mater Interfaces
Pays: United States
ID NLM: 101504991

Informations de publication

Date de publication:
02 Aug 2024
Historique:
medline: 2 8 2024
pubmed: 2 8 2024
entrez: 2 8 2024
Statut: aheadofprint

Résumé

A Pt skin effect, i.e., an enrichment of Pt within the first 1-2 nm from the surface, is observed in as-prepared electrodeposited Ni-rich Ni-Pt thin films. This effect, revealed by Rutherford backscattering (RBS), is present for both dense thin films and mesoporous thin films synthesized by micelle-assisted electrodeposition from a chloride-based electrolyte. Due to the Pt skin effect, the Ni-rich thin films show excellent stability at the hydrogen evolution reaction (HER) in acidic media, during which a gradient in the Pt/Ni ratio is established along the thickness of the thin films, while the activity at the HER remains unaffected by this structural change. Further characterization by elastic recoil detection with He ions analysis shows that hydrogen profiles are similar to those of Pt: a surface hydrogen peak coincides with the Pt skin, and a gradient in hydrogen concentration is established during HER in acidic media, together with a considerable uptake in hydrogen. A comparative study shows that in alkaline media, hydrogen evolution has little to no effect on the structural properties of the thin films, even for much longer times of exposure. The mesoporous thin films, in addition to their higher efficiency at HER compared to dense thin films, also show lower internal stress, as determined by Rietveld refinement of grazing incidence X-ray diffraction patterns. The latter also reveal a fully single-phase and nanocrystalline structure for all thin films with varying Ni contents.

Identifiants

pubmed: 39092459
doi: 10.1021/acsami.4c09288
doi:

Types de publication

Journal Article

Langues

eng

Sous-ensembles de citation

IM

Auteurs

Konrad Eiler (K)

Departament de Física, Universitat Autònoma de Barcelona, 08193 Bellaterra, Spain.

Salvador Pané (S)

Institute of Robotics and Intelligent Systems (IRIS), ETH Zurich, CH-8092 Zurich, Switzerland.

Max Döbeli (M)

Laboratory of Ion Beam Physics, ETH Zurich, Otto-Stern-Weg 5, CH-8093 Zurich, Switzerland.

Arnold Müller (A)

Laboratory of Ion Beam Physics, ETH Zurich, Otto-Stern-Weg 5, CH-8093 Zurich, Switzerland.

Christof Vockenhuber (C)

Laboratory of Ion Beam Physics, ETH Zurich, Otto-Stern-Weg 5, CH-8093 Zurich, Switzerland.

Jordi Sort (J)

Departament de Física, Universitat Autònoma de Barcelona, 08193 Bellaterra, Spain.
Institució Catalana de Recerca i Estudis Avançats (ICREA), Pg. Lluís Companys 23, 08010 Barcelona, Spain.

Eva Pellicer (E)

Departament de Física, Universitat Autònoma de Barcelona, 08193 Bellaterra, Spain.

Classifications MeSH