A High Dynamic Range Ion Detector for Multireflection Time-of-Flight Analyzers.
Journal
Journal of the American Society for Mass Spectrometry
ISSN: 1879-1123
Titre abrégé: J Am Soc Mass Spectrom
Pays: United States
ID NLM: 9010412
Informations de publication
Date de publication:
03 Aug 2024
03 Aug 2024
Historique:
medline:
4
8
2024
pubmed:
4
8
2024
entrez:
3
8
2024
Statut:
aheadofprint
Résumé
Reflectron-based time-of-flight analyzers rely on subnanosecond detector time response to achieve acceptable resolving power for low-mid-mass, multiple-ion peaks. With the adoption of multireflection analyzers, order of magnitude longer folded ion paths relax restrictions on detector response time, allowing implementation of new technologies that greatly improve dynamic range, detector lifetime, and ion detection efficiency. A detection system is presented, integrated into a multireflection analyzer, that combines 10 keV postacceleration and focal plane correction with a unique BxE focusing, optically coupled detector, preamplification, and dual-channel digitization. Calibration and peak-handling methods are also described. The instrument demonstrated >1 × 10
Identifiants
pubmed: 39096288
doi: 10.1021/jasms.4c00230
doi:
Types de publication
Journal Article
Langues
eng
Sous-ensembles de citation
IM