X-ray tensor tomography for small-grained polycrystals with strong texture.
SAXS
WAXS
tensor tomography
texture analysis
wide- and small-angle X-ray scattering
Journal
Journal of applied crystallography
ISSN: 0021-8898
Titre abrégé: J Appl Crystallogr
Pays: United States
ID NLM: 9876190
Informations de publication
Date de publication:
01 Aug 2024
01 Aug 2024
Historique:
received:
08
12
2023
accepted:
15
05
2024
medline:
7
8
2024
pubmed:
7
8
2024
entrez:
7
8
2024
Statut:
epublish
Résumé
Small-angle X-ray tensor tomography and the related wide-angle X-ray tensor tomography are X-ray imaging techniques that tomographically reconstruct the anisotropic scattering density of extended samples. In previous studies, these methods have been used to image samples where the scattering density depends slowly on the direction of scattering, typically modeling the directionality,
Identifiants
pubmed: 39108827
doi: 10.1107/S1600576724004588
pii: S1600576724004588
pmc: PMC11299598
doi:
Types de publication
Journal Article
Langues
eng
Pagination
986-1000Informations de copyright
© Mads Carlsen et al. 2024.