The effect of the acceleration voltage on the quality of structure determination by 3D-electron diffraction.

3D electron diffraction (3DED) Structure refinement Structure solution Transmission electron microscope (TEM)

Journal

Ultramicroscopy

ISSN: 1879-2723

Titre abrégé: Ultramicroscopy

Pays: Netherlands

ID NLM: 7513702

Informations de publication

Date de publication:
05 Aug 2024

Historique:

received: 19 04 2024

revised: 25 07 2024

accepted: 01 08 2024

medline: 19 8 2024

pubmed: 19 8 2024

entrez: 18 8 2024

Statut: aheadofprint

Résumé

Nowadays, 3D Electron Diffraction (3DED) is widely used for the structure determination of sub-micron-sized particles. In this work, we investigate the influence of the acceleration voltage on the quality of 3DED datasets acquired on BaTiO

Identifiants

DOI: 10.1016/j.ultramic.2024.114022 PMID: 39154615

pubmed: 39154615

pii: S0304-3991(24)00101-3

doi: 10.1016/j.ultramic.2024.114022

pii:

doi:

Types de publication

Journal Article

Langues

eng

Sous-ensembles de citation

Pagination

114022

Informations de copyright

Déclaration de conflit d'intérêts

Declaration of competing interest The authors declare that they have no known competing financial interests or personal relationships that could have appeared to influence the work reported in this paper.