Atomic-Scale Scanning of Domain Network in the Ferroelectric HfO

HfO2 crystal structure domain network ferroelectricity grain boundaries

Journal

ACS nano
ISSN: 1936-086X
Titre abrégé: ACS Nano
Pays: United States
ID NLM: 101313589

Informations de publication

Date de publication:
12 Sep 2024
Historique:
medline: 12 9 2024
pubmed: 12 9 2024
entrez: 12 9 2024
Statut: aheadofprint

Résumé

Ferroelectric HfO

Identifiants

pubmed: 39265148
doi: 10.1021/acsnano.4c08721
doi:

Types de publication

Journal Article

Langues

eng

Sous-ensembles de citation

IM

Auteurs

Kunwoo Park (K)

Center for Nanoparticle Research, Institute for Basic Science (IBS), Seoul 08826, Republic of Korea.
School of Chemical and Biological Engineering, Institute of Chemical Process, Seoul National University, Seoul 08826, Republic of Korea.

Dongmin Kim (D)

Center for Nanoparticle Research, Institute for Basic Science (IBS), Seoul 08826, Republic of Korea.
School of Chemical and Biological Engineering, Institute of Chemical Process, Seoul National University, Seoul 08826, Republic of Korea.
Samsung Advanced Institute of Technology, Samsung Electronics, Suwon-si, Gyeonggi-do 16678, Republic of Korea.

Kyoungjun Lee (K)

Department of Physics Education, Seoul National University, Seoul 08826, Republic of Korea.

Hyun-Jae Lee (HJ)

Department of Energy Engineering, School of Energy and Chemical Engineering, Ulsan National Institute of Science and Technology (UNIST), Ulsan 44919, Republic of Korea.

Jihoon Kim (J)

Center for Nanoparticle Research, Institute for Basic Science (IBS), Seoul 08826, Republic of Korea.
School of Chemical and Biological Engineering, Institute of Chemical Process, Seoul National University, Seoul 08826, Republic of Korea.

Sungsu Kang (S)

Center for Nanoparticle Research, Institute for Basic Science (IBS), Seoul 08826, Republic of Korea.
School of Chemical and Biological Engineering, Institute of Chemical Process, Seoul National University, Seoul 08826, Republic of Korea.

Alex Lin (A)

National Center for Electron Microscopy, Molecular Foundry, Lawrence Berkeley National Laboratory, Berkeley, California 94720, United States.

Alexander J Pattison (AJ)

National Center for Electron Microscopy, Molecular Foundry, Lawrence Berkeley National Laboratory, Berkeley, California 94720, United States.

Wolfgang Theis (W)

Nanoscale Physics Research Laboratory, School of Physics and Astronomy, University of Birmingham, Birmingham B15 2TT, U.K.

Chang Hoon Kim (CH)

Department of Energy Engineering, School of Energy and Chemical Engineering, Ulsan National Institute of Science and Technology (UNIST), Ulsan 44919, Republic of Korea.

Hyesung Choi (H)

Center for Nanoparticle Research, Institute for Basic Science (IBS), Seoul 08826, Republic of Korea.
School of Chemical and Biological Engineering, Institute of Chemical Process, Seoul National University, Seoul 08826, Republic of Korea.

Jung Woo Cho (JW)

Department of Physics Education, Seoul National University, Seoul 08826, Republic of Korea.

Peter Ercius (P)

National Center for Electron Microscopy, Molecular Foundry, Lawrence Berkeley National Laboratory, Berkeley, California 94720, United States.

Jun Hee Lee (JH)

Department of Energy Engineering, School of Energy and Chemical Engineering, Ulsan National Institute of Science and Technology (UNIST), Ulsan 44919, Republic of Korea.

Seung Chul Chae (SC)

Department of Physics Education, Seoul National University, Seoul 08826, Republic of Korea.

Jungwon Park (J)

Center for Nanoparticle Research, Institute for Basic Science (IBS), Seoul 08826, Republic of Korea.
School of Chemical and Biological Engineering, Institute of Chemical Process, Seoul National University, Seoul 08826, Republic of Korea.
Institute of Engineering Research, College of Engineering, Seoul National University, Seoul 08826, Republic of Korea.
Advanced Institute of Convergence Technology, Seoul National University, Suwon-si, Gyeonggi-do 16229, Republic of Korea.

Classifications MeSH