The 4D Camera: An 87 kHz Direct Electron Detector for Scanning/Transmission Electron Microscopy.

4D-STEM active pixel sensor direct electron detector phase contrast STEM scanning transmission electron microscopy

Journal

Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada
ISSN: 1435-8115
Titre abrégé: Microsc Microanal
Pays: England
ID NLM: 9712707

Informations de publication

Date de publication:
19 Sep 2024
Historique:
received: 08 05 2024
revised: 09 08 2024
accepted: 20 08 2024
medline: 22 9 2024
pubmed: 22 9 2024
entrez: 19 9 2024
Statut: aheadofprint

Résumé

We describe the development, operation, and application of the 4D Camera-a 576 by 576 pixel active pixel sensor for scanning/transmission electron microscopy which operates at 87,000 Hz. The detector generates data at ∼480 Gbit/s which is captured by dedicated receiver computers with a parallelized software infrastructure that has been implemented to process the resulting 10-700 Gigabyte-sized raw datasets. The back illuminated detector provides the ability to detect single electron events at accelerating voltages from 30 to 300 kV. Through electron counting, the resulting sparse data sets are reduced in size by 10--300× compared to the raw data, and open-source sparsity-based processing algorithms offer rapid data analysis. The high frame rate allows for large and complex scanning diffraction experiments to be accomplished with typical scanning transmission electron microscopy scanning parameters.

Identifiants

DOI: 10.1093/mam/ozae086 PMID: 39298134
pubmed: 39298134
pii: 7762045
doi: 10.1093/mam/ozae086
pii:
doi:

Types de publication

Journal Article

Langues

eng

Sous-ensembles de citation

IM

Informations de copyright

© The Author(s) 2024. Published by Oxford University Press on behalf of the Microscopy Society of America.

Déclaration de conflit d'intérêts

Conflict of Interest The authors declare that they have no competing interest.

Auteurs

Peter Ercius (P)

National Center for Electron Microscopy, Molecular Foundry, Lawrence Berkeley National Laboratory, Berkeley, CA 94720, USA.
ORCID: 0000-0002-6762-9976

Ian J Johnson (IJ)

Division of Engineering, Lawrence Berkeley National Laboratory, Berkeley, CA 94720, USA.

Philipp Pelz (P)

National Center for Electron Microscopy, Molecular Foundry, Lawrence Berkeley National Laboratory, Berkeley, CA 94720, USA.

Benjamin H Savitzky (BH)

National Center for Electron Microscopy, Molecular Foundry, Lawrence Berkeley National Laboratory, Berkeley, CA 94720, USA.

Lauren Hughes (L)

National Center for Electron Microscopy, Molecular Foundry, Lawrence Berkeley National Laboratory, Berkeley, CA 94720, USA.

Hamish G Brown (HG)

National Center for Electron Microscopy, Molecular Foundry, Lawrence Berkeley National Laboratory, Berkeley, CA 94720, USA.

Steven E Zeltmann (SE)

Department of Materials Science and Engineering, University of California Berkeley, Berkeley, CA 94720, USA.

Shang-Lin Hsu (SL)

Department of Materials Science and Engineering, University of California Berkeley, Berkeley, CA 94720, USA.

Cassio C S Pedroso (CCS)

Molecular Foundry, Lawrence Berkeley National Laboratory, Berkeley, CA 94720, USA.

Bruce E Cohen (BE)

Molecular Foundry, Lawrence Berkeley National Laboratory, Berkeley, CA 94720, USA.
Division of Molecular Biophysics and Integrated Bioimaging, Lawrence Berkeley National Laboratory, Berkeley, CA 94720, USA.

Ramamoorthy Ramesh (R)

Department of Materials Science and Engineering, University of California Berkeley, Berkeley, CA 94720, USA.
Division of Materials Science, Lawrence Berkeley National Laboratory, Berkeley, CA 94720, USA.
Department of Physics, University of California Berkeley, Berkeley, CA 94720, USA.

David Paul (D)

National Energy Research Scientific Computing Center, Lawrence Berkeley National Laboratory, Berkeley, CA 94720, USA.

John M Joseph (JM)

Division of Engineering, Lawrence Berkeley National Laboratory, Berkeley, CA 94720, USA.

Thorsten Stezelberger (T)

Division of Engineering, Lawrence Berkeley National Laboratory, Berkeley, CA 94720, USA.

Cory Czarnik (C)

Gatan Inc., Pleasanton, CA 94588, USA.

Matthew Lent (M)

Gatan Inc., Pleasanton, CA 94588, USA.

Erin Fong (E)

Division of Engineering, Lawrence Berkeley National Laboratory, Berkeley, CA 94720, USA.

Jim Ciston (J)

National Center for Electron Microscopy, Molecular Foundry, Lawrence Berkeley National Laboratory, Berkeley, CA 94720, USA.

Mary C Scott (MC)

National Center for Electron Microscopy, Molecular Foundry, Lawrence Berkeley National Laboratory, Berkeley, CA 94720, USA.
Department of Materials Science and Engineering, University of California Berkeley, Berkeley, CA 94720, USA.

Colin Ophus (C)

National Center for Electron Microscopy, Molecular Foundry, Lawrence Berkeley National Laboratory, Berkeley, CA 94720, USA.

Andrew M Minor (AM)

National Center for Electron Microscopy, Molecular Foundry, Lawrence Berkeley National Laboratory, Berkeley, CA 94720, USA.
Department of Materials Science and Engineering, University of California Berkeley, Berkeley, CA 94720, USA.

Peter Denes (P)

National Center for Electron Microscopy, Molecular Foundry, Lawrence Berkeley National Laboratory, Berkeley, CA 94720, USA.

Classifications MeSH