Development and Test of Low-Cost Multi-Channel Multi-Frequency Lock-In Amplifier for Health and Environment Sensing.

digital signal processing lock-in amplifier (LIA) microcontroller photoluminescence measurements

Journal

Sensors (Basel, Switzerland)
ISSN: 1424-8220
Titre abrégé: Sensors (Basel)
Pays: Switzerland
ID NLM: 101204366

Informations de publication

Date de publication:
18 Sep 2024
Historique:
received: 08 07 2024
revised: 25 08 2024
accepted: 13 09 2024
medline: 28 9 2024
pubmed: 28 9 2024
entrez: 28 9 2024
Statut: epublish

Résumé

Optical-based sensing techniques and instruments, such as fluorometric systems, absorbance-based sensors, and photoacoustic spectrometers, are important tools for detecting food fraud, adulteration, and contamination for health and environmental purposes. All the aforementioned optical equipments generally require one or more low-frequency Lock-In Amplifiers (LIAs) to extract the signal of interest from background noise. In the cited applications, the required LIA frequency is quite low (up to 1 kHz), and this leads to a simplification of the hardware with consequent good results in portability, reduced size, weight, and low-cost characteristics. The present system, called ENEA DSP Box Due, is based on a very inexpensive microcontroller proto-board and can replace four commercial LIAs, resulting in significant savings in both cost and space. Furthermore, it incorporates a dual-channel oscilloscope and a sinusoidal function generator. This article outlines the architecture of the ENEA DSP Box Due, its electrical characterization, and its applications within a project concerning laser techniques for food and water safety.

Identifiants

pubmed: 39338765
pii: s24186020
doi: 10.3390/s24186020
pii:
doi:

Types de publication

Journal Article

Langues

eng

Sous-ensembles de citation

IM

Subventions

Organisme : Regione Lazio through Progetto Gruppi di Ricerca POR FESR LAZIO 2014 - 2020
ID : Id: A0375-2020-36403 according to G09493 of 14 July 2021

Auteurs

Fabio Pollastrone (F)

Diagnostics and Metrology Laboratory, Physical Technologies and Security Division, Nuclear Department, ENEA (Italian National Agency for New Technologies, Energy and Sustainable Economic Development), Via Enrico Fermi 45, 00044 Frascati, Italy.

Luca Fiorani (L)

Diagnostics and Metrology Laboratory, Physical Technologies and Security Division, Nuclear Department, ENEA (Italian National Agency for New Technologies, Energy and Sustainable Economic Development), Via Enrico Fermi 45, 00044 Frascati, Italy.

Ramanand Bisauriya (R)

Department of Industrial Engineering, University of Rome Tor Vergata, 00133 Rome, Italy.

Ivano Menicucci (I)

Diagnostics and Metrology Laboratory, Physical Technologies and Security Division, Nuclear Department, ENEA (Italian National Agency for New Technologies, Energy and Sustainable Economic Development), Via Enrico Fermi 45, 00044 Frascati, Italy.

Claudio Ciceroni (C)

Diagnostics and Metrology Laboratory, Physical Technologies and Security Division, Nuclear Department, ENEA (Italian National Agency for New Technologies, Energy and Sustainable Economic Development), Via Enrico Fermi 45, 00044 Frascati, Italy.

Roberto Pizzoferrato (R)

Department of Industrial Engineering, University of Rome Tor Vergata, 00133 Rome, Italy.

Classifications MeSH